Methods, apparatuses, systems, and computer program products for multi-point shunt calibration

ABSTRACT

Embodiments of the present disclosure include methods, apparatuses, systems, and computer program product for enabling multi-point shunt calibration of a sensor device. Multi-point shunt calibration provides at least a first, second, and third simulated calibration output, each simulated calibration output corresponding to an actual reading value and an expected reading value. The simulated calibration outputs are associated with a predefined output sequence, where each simulated calibration output is separated from an adjacent simulated calibration output by an output step size. Some embodiments are configured for automatically outputting each simulated calibration output for a particular period of time before outputting an adjacent simulated calibration output in the predefined output sequence. The various simulated calibration outputs, actual reading values, and/or expected values may be used in determining calibrated reading values for the sensor device.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. Non-Provisional applicationSer. No. 17/646,953, titled “METHODS, APPARATUSES, SYSTEMS, AND COMPUTERPROGRAM PRODUCTS FOR MULTI-POINT SHUNT CALIBRATION,” filed Jan. 4, 2022,which is a continuation of and claims priority to U.S. Non-Provisionalapplication Ser. No. 16/394,273, filed Apr. 25, 2019, and titled“METHODS, APPARATUSES, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FORMULTI-POINT SHUNT CALIBRATION,” the contents of which are incorporatedherein by reference in their entirety.

TECHNOLOGICAL FIELD

Embodiments of the disclosure relate, generally, to methods,apparatuses, systems, and computer program products for enablingmulti-point shunt calibration of a sensor device

BACKGROUND

Current methods, systems, apparatuses, and computer program products forenabling shunt calibration of sensor devices exhibit a plurality ofproblems that make current systems inefficient, insufficient, and/ornon-ideal in practical use. Through applied effort, ingenuity, andinnovation, solutions to improve such methods, systems, apparatuses, andcomputer program products have been realized and are described inconnection with embodiments of the present disclosure.

BRIEF SUMMARY

Provided herein is a multi-point shunt calibration apparatus, method,and system that may allow for calibration of a sensor device to a highlyaccurate degree across the entire operating range of the sensor devicewhile detecting and/or addressing various problems. For example,multi-point shunt calibration may enable calibration of adjustablesensor parameters to address problems associated with non-linearity,hysteresis, dead zones, and the like. Multi-point shunt calibration maydrive the sensor device with various simulated calibration outputs, thevarious simulated calibration outputs having various values, for exampleat least a first simulated calibration output (e.g., a lower boundarysimulated calibration output), a second simulated calibration output(e.g., an intermediate simulated calibration output), and a thirdsimulated calibration output (e.g., an upper boundary simulatedcalibration output). The various simulated calibration outputs may beassociated with a predefined output sequence, such that the embodimentsprovide each simulated calibration output in a particular order, eitherautomatically or based on engagement from a user/operator. Eachsimulated calibration output may be associated with a correspondingactual reading value produced by the sensor device, and an expectedreading value. Problems with the sensor device may be identified,detected, and/or addressed based on the simulated calibration output(s),the actual reading value(s), the expected reading value(s), or acombination thereof. For instance, the various actual reading valuesand/or expected reading values may be utilized to generate a calibratedlookup table associated with the sensor, for use in generatingcalibrated reading values. Alternatively, a calibrated reading value forthe sensor device may be determined by taking into account any deviationfound between the first, second, and third actual reading values ordeviation between the actual reading values and corresponding expectedreading values. Alternatively or additionally, one or more calibratedparameter values may be generated for one or more adjustable sensorparameters associated with the sensor device, which may be used todetermine a calibrated reading value for the sensor device or calibratethe sensor device to produce calibrated reading values.

Embodiments provided herein are directed to a multi-point shuntcalibration apparatus. The multi-point shunt calibration apparatuscomprises a calibration component in communication with a sensor device.The calibration component may be configured to output a first simulatedcalibration output; output a second simulated calibration output after afirst period of time following output of the first simulated calibrationoutput; and output a third simulated calibration output after a secondperiod of time following output of the second simulated calibrationoutput. The first, second, and third simulated calibration outputs maybe associated with a predefined output sequence within an operatingrange associated with the sensor device. The first, second, and thirdsimulated calibration outputs may each cause the sensor device toproduce a first, second, and third actual reading value, respectively.The first simulated calibration output may be separated from the secondsimulated calibration output by a first output step size, and the secondsimulated calibration output may be separated from the third simulatedcalibration output by a second output step size.

In some embodiments, the calibration component comprises a plurality ofoptocouplers; a plurality of output adjustment switches, each outputadjustment switch associated with an optocoupler of the plurality ofoptocouplers; a plurality of fixed resistors, each fixed resistorassociated with an output adjustment switch of the plurality of outputadjustment switches. The plurality of optocouplers corresponds to aplurality of calibration input values, each calibration input valueassociated with activating at least one of the plurality ofoptocouplers.

In some embodiments, the calibration component comprises a calibrationswitch or a calibration command control; a multi-point shunt calibrationmicrocontroller configured to produce at least a first pulse widthmodulated calibration value associated with the first simulatedcalibration output, a second pulse width modulated calibration valueassociated with the second simulated calibration output, and a thirdpulse width modulated calibration value associated with the third; an RCfilter; and an output driver.

In some embodiments, the calibration component comprises a calibrationswitch or a calibration command control; a multi-point shunt calibrationmicrocontroller configured to produce at least a first interpretablecalibration value associated with the first simulated calibrationoutput, a second interpretable calibration value associated with thesecond simulated calibration output, and a third interpretablecalibration value associated with the third simulated calibrationoutput; a digital-to-analog converter; and an output driver.

In some embodiments, the calibration component comprises a calibrationswitch or a calibration command control, and the calibration componentis configured to receive a calibration initialization signal; andreceive a calibration deinitialization signal. The calibration componentis configured for outputting the first simulated calibration output inresponse to the calibration initialization signal, and the calibrationcomponent stops outputting the third simulated calibration component inresponse to receiving the calibration deinitialization signal. Thecalibration initialization signal may be received in response to a firstuser engagement, and the calibration deinitialization signal may bereceived in response to a second user engagement.

In some embodiments, the calibration component receives an outputadjustment signal, wherein the first period of time ends in response toreceiving the output adjustment signal. The output adjustment signal maybe received in response to engagement with a calibration switch or acalibration command control.

In some embodiments, the first period of time and/or second period oftime are associated with one or more automatic output time shiftinterval(s). The first period of time may be associated with a firstautomatic output time shift interval, where the calibration component isconfigured to determine the first period of time satisfies the automaticoutput time shift interval, and output the second simulated calibrationoutput in response.

In some embodiments, the calibration component comprises a hold input.The calibration component may receive a hold initialization signal inresponse to a first user engagement with the hold input; and continueoutputting a presently outputted simulated calibration output. Thepresently outputted simulated calibration output may be dependent onwhere the calibration component is in the predefined output sequence,and may be the first simulated calibration output, the second simulatedcalibration output, or the third simulated calibration output.

In some embodiments, the calibration component is further configured torepeat output of the first simulated calibration output, the secondsimulated calibration output, and the third simulated calibration outputaccording to the predefined output sequence. Additional simulatedcalibration outputs may also be repeatedly output. The first, second,and third simulated calibration outputs may be associated with apredefined output sequence within an operating range associated with asensor device. The first, second, and third simulated calibrationoutputs may each cause the sensor device to produce a first, second, andthird actual reading value, respectively. The first simulatedcalibration output may be separated from the second simulatedcalibration output by a first output step size, and the second simulatedcalibration output may be separated from the third simulated calibrationoutput by a second output step size.

Additional embodiments provided herein are directed to a multi-pointshunt calibration method. The method includes outputting a firstsimulated calibration output; outputting a second simulated calibrationoutput after a first period of time following outputting of the firstsimulated calibration output; and outputting a third simulatedcalibration output after a second period of time following outputting ofthe second simulated calibration output. The first, second, and thirdsimulated calibration outputs are associated with a predefined outputsequence within an operating range associated with a sensor device. Thefirst simulated calibration output, the second simulated calibrationoutput, and the third simulated calibration output may be configured tocause the sensor device to produce a first, second, and third readingvalue, respectively. The first simulated calibration output may beseparated from the second simulated calibration output by a first outputstep size, and the second simulated calibration output is separated fromthe third simulated calibration output by a second output step size.

In some embodiments, outputting the first, second, and third simulatedcalibration outputs utilizes a plurality of optocouplers, a plurality ofoutput adjustment switches, and a plurality of fixed resistors, whereeach output adjustment switch of the plurality of output adjustmentswitches is controlled based on an optocoupler of the plurality ofoptocouplers, and where each fixed resistor of the plurality of fixedresistors is associated with an output adjustment switch of theplurality of output adjustment switches, and where the plurality ofoptocouplers corresponds to a plurality of calibration input values,each calibration input value associated with activation of at least oneof the plurality of optocouplers.

In some embodiments, outputting the first, second, and third simulatedcalibration output comprises outputting an interpretable calibrationvalue from a multi-point shunt calibration microcontroller to adigital-analog converter; outputting a converted calibration signalbased on the interpretable calibration value from the digital-to-analogconverter to an output driver, where the output driver outputs thesimulated calibration output based on the converted calibration signal.

In some embodiments, outputting the first, second, and third simulatedcalibration output comprises outputting a pulse width modulatedcalibration value from a multi-point shunt calibration microcontrollerto a RC filter; outputting a filtered calibration signal based on thepulse width modulated calibration value from the RC filter to the outputdriver, where the output driver outputs the simulated calibration outputbased on the filtered calibration signal.

In some embodiments, the method further comprises receiving acalibration initialization signal in response to a first user engagementwith a calibration switch or a calibration command control, whereinoutputting the first simulated calibration output is in response toreceiving the calibration initialization signal; receiving a calibrationdeinitialization signal in response to a second user engagement with thecalibration switch or the calibration command control; and stoppingoutputting the third simulated calibration output in response to thecalibration deinitialization signal.

In some embodiments, the method further includes receiving an outputadjustment signal, where the first period of time ends in response toreceiving the output adjustment signal. In some embodiments, the methodfurther includes receiving a second output adjustment signal, where thesecond period of time ends in response to receiving the second outputadjustment signal.

In some embodiments, the first time period is associated with anautomatic output time shift interval, where the method further includesdetermining the first period of time that satisfies the automatic outputtime shift interval. In some embodiments, the method further includesrepeating outputting of the first simulated calibration output, thesecond simulated calibration output, and the third simulated calibrationoutput according to the predefined output sequence.

In some embodiments, the method further includes generating acalibration lookup table associated with the sensor device based on atleast a first, second, and third actual reading values associated withthe first, second, and third simulated calibration output, respectively.

Additional embodiments provided herein are directed to a multi-pointshunt calibration system. The system comprises a measuring bridgecircuit. The system may additionally include a calibration component incommunication with the sensor device, the calibration componentconfigured to output a first simulated calibration output; output asecond simulated calibration output after a first period of timefollowing output of the first simulated calibration output; and output athird simulated calibration output after a second period of timefollowing output of the second simulated calibration output. The first,second, and third simulated calibration outputs may be associated with apredefined output sequence within an operating range associated with thesensor device. The first, second, and third simulated calibrationoutputs may be each configured to cause the sensor device to provide afirst, second, and third actual reading value, respectively.

In some embodiments of the system, the calibration component comprises acalibration switch or calibration command control, and a multi-pointshunt calibration microcontroller in communication a digital-to-analogconverter, and an output driver in communication with thedigital-to-analog converter. In some embodiments of the system, thecalibration comprises a multi-point shunt microcontroller incommunication with a RC filter, and an output driver in communicationwith the RC filter.

In some embodiments, the calibration component includes a multi-pointshunt calibration circuit. The multi-point shunt calibration circuit maycomprise a plurality of optocouplers, a plurality of output adjustmentswitches, and a plurality of fixed resistors. Each optocoupler, outputadjustment switch, and fixed resistor may be associated with acalibration value input in a plurality of calibration value inputs, forexample associated with a calibration switch or a calibration commandcontrol.

In some embodiments, the multi-point shunt calibration system includes asensor adjustment component configured to determine a calibrated sensorparameter value for at least one adjustable sensor parameter associatedwith the sensor device. The calibrated sensor value may be based on atleast the first actual reading value, the second actual reading value,and the third actual reading value.

In some embodiments, the predefined output sequence is associated withat least one additional simulated calibration output and the calibrationcomponent is further configured to output each of the at least oneadditional simulated calibration output for an additional period oftime.

In some embodiments of the system, the calibration component is furtherconfigured to repeat output of the first simulated calibration output,the second simulated calibration output, and the third simulatedcalibration output according to the predefined output sequence. Thecalibration component may further repeat outputting one or moreadditional simulated calibration outputs.

In some embodiments, the first simulated calibration output is aninitial simulated calibration output, the second simulated calibrationoutput is an intermediate simulated calibration output, and the thirdsimulated calibration output is a boundary simulated calibration output.

In some embodiments, each output step size is a percentage output stepsize associated with the operating range associated with the sensordevice. Each output step size may be the same size. In otherembodiments, various output step sizes may be different step sizes.

In some embodiments of the system, the system further includes a holdinput, and the calibration component is further configured to receive ahold initialization signal in response to a first user engagement withthe hold input, and continue outputting a presently outputted simulatedcalibration output, where the presently outputted simulated calibrationoutput is one selected from the group of the first simulated calibrationoutput, the second simulated calibration output, and the third simulatedcalibration output. In some embodiments, the hold input comprises ananalog hold switch or a digital hold switch.

Additional embodiments provided herein are directed to a multi-pointshunt calibration sensor device comprising a measuring bridge component;and a shunt calibration component configured to determine a first actualreading value associated with a first simulated calibration output;determine a second actual reading value associated with a secondsimulated calibration output; determine a third actual reading valueassociated with a third simulated calibration output; and determine acalibrated reading value associated with the measuring bridge componentbased on the first actual reading value, second actual reading value,and third actual reading value, wherein the first, second, and thirdsimulated calibration outputs are associated with different expectedreading values within an operating range of the multi-point shuntcalibration sensor device. The shunt calibration component may befurther configured to determine at least one additional actual readingvalue associated with at least one additional simulated calibrationoutput, wherein the calibrated reading value is further based on the atleast one additional actual reading value. The first, second, and thirdsimulated calibration outputs may be associated with a predefined outputsequence. The first, second, and third simulated calibration outputs maybe associated with an automatic output shift time interval.

In some embodiments, the first actual reading value is associated with afirst expected reading value, the second actual reading value isassociated with a second expected reading value, and the third actualreading value is associated with a third expected reading value, and thecalibrated reading value is based on a first error value based on thefirst actual reading value and the first expected reading value, asecond error value based on the second actual reading value and thesecond expected reading value, and a third error value based on thethird actual reading value and the third expected reading value.

In some embodiments, the calibrated reading value is determined at leastusing the formula:

$\frac{\left( {{{Second}{Actual}{Reading}{Value}} - \left( \frac{\begin{matrix}{{{First}{Actual}{Reading}{Value}} +} \\{{Third}{Actual}{Reading}{Value}}\end{matrix}}{2} \right)} \right)*100}{{{Third}{Actual}{Reading}{Value}} - {{First}{Actual}{Reading}{Value}}}.$For instance, the formula may be used to adjust the uncalibrated readingvalue to the calibrated reading value. In some embodiments, the formulamay be used to determine a calibrated sensor parameter value for anadjustable sensor parameter. Such calibrated sensor parameter value maybe used to adjust the sensor device or stored for future used indetermining the calibrated reading value.

An embodiment multi-point shunt calibration sensor device is alsoprovided for. In some embodiments, the multi-point shunt calibrationsensor device includes at least a measuring bridge and a shuntcalibration component. In some embodiments, the shunt calibrationcomponent may be configured to determine a first actual reading valueassociated with a first simulated calibration output; determine a secondactual reading value associated with a second simulated calibrationoutput; determine a third actual reading value associated with a thirdsimulated calibration output; and determine a calibrated reading valuebased on the first actual reading value, second actual reading value,and third actual reading value, where the first, second, and thirdsimulated calibration outputs are associated with different expectedreading values within an operating range of the multi-point shuntcalibration sensor device.

In some other embodiments, the shunt calibration component of theembodiment multi-point shunt calibration sensor device is furtherconfigured to determine at least one additional actual reading valueassociated with at least one additional simulated calibration output,where the calibrated reading value is further based on the at least oneadditional actual reading value.

In some embodiments of the multi-point shunt calibration sensor device,the first, second, and third simulated calibration outputs areassociated with a predefined output sequence. In some embodiments of themulti-point shunt calibration sensor device, the first, second, andthird simulated calibration outputs are associated with an automaticoutput shift time interval. In some embodiments of the multi-point shuntcalibration sensor device, the first actual reading value is associatedwith a first expected reading value, the second actual reading value isassociated with a second expected reading value, and the third actualreading value is associated with a third expected reading value, wherethe calibrated reading value is based on a first error value based onthe first actual reading value and the first expected reading value, asecond error value based on the second actual reading value and thesecond expected reading value, and a third error value based on thethird actual reading value and the third expected reading value.

In some embodiments of the multi-point shunt calibration sensor device,the non-linearity of an actual reading value, which may be used todetermine a calibrated reading value, is determined at least using theformula

$\frac{\left( {{{Sensor}{Output}{at}50\%} - \frac{\begin{matrix}{{{Sensor}{Output}{at}0\%} +} \\{{Sensor}{Output}{at}{}100\%}\end{matrix}}{2}} \right)*100}{{{Sensor}{Output}{at}100\%} - {{Sensor}{Output}{at}0\%}}.$

In some embodiments, the first actual reading value represents thesensor output at 0%, the second actual reading value represents thesensor output at 50%, and the third actual reading value represents thesensor output at 100%.

In some embodiments of the multi-point shunt calibration sensor device,the hysteresis of an actual reading value, which may be used todetermine a calibrated reading value, is determined at least using theformula

$\frac{\begin{matrix}\left( {{{Sensor}{Output}{at}{}50\%{Going}{Up}} -} \right. \\{\left. {{Sensor}{Output}{at}{}50\%{Going}{Down}} \right)*100}\end{matrix}}{{{Sensor}{Output}{at}100\%} - {{Sensor}{Output}{at}0\%}}$associated with a predefined output sequence.

In some embodiments, the first actual reading value represents thesensor output at 0%, the second actual reading value represents thesensor output at 50% going up, the third actual reading value representsthe sensor output at 100%, and a fourth actual reading value representsthe sensor output at 50% going down.

In some embodiments, a computer program product is provided for. Thecomputer program product may include a non-transitory computer-readablememory having program code instructions therein. The program codeinstructions may be configured to, when executed by a processor, performone or more operations and/or methods. For example, the program codeinstructions may be configured to cause the processor to perform thesteps of the computer-implemented methods, and/or operations thereof,discussed herein.

BRIEF DESCRIPTION OF THE DRAWINGS

Having thus described the disclosure in general terms, reference willnow be made to the accompanying drawings, which are not necessarilydrawn to scale, and wherein:

FIG. 1 illustrates a schematic block diagram of example circuitry for asystem in accordance with example embodiments of the present disclosure;

FIG. 2 illustrates a block diagram showing an example multi-point shuntcalibration apparatus in accordance with example embodiments of thepresent disclosure;

FIG. 3 illustrates a block diagram showing data flow between componentsof an example multi-point shunt calibration apparatus in accordance withexample embodiments of the present disclosure;

FIG. 4 illustrates a block diagram showing data flow between componentsof another example multi-point shunt calibration apparatus in accordancewith example embodiments of the present disclosure;

FIG. 5 illustrates a circuit diagram showing an example shuntinitialization circuit in accordance with example embodiments of thepresent disclosure;

FIG. 6 illustrates a circuit diagram showing an example multi-pointshunt calibration circuit arrangement in accordance with exampleembodiments of the present disclosure;

FIG. 7 illustrates a flowchart describing example operations formulti-point shunt calibration of a sensor device in accordance with someexample embodiments of the present disclosure;

FIG. 8 illustrates a flowchart describing example operations formulti-point shunt calibration of a sensor device, specifically forholding the output of a simulated calibration output, in accordance withsome example embodiments of the present disclosure; and

FIG. 9 illustrates a simulated calibration output diagram in accordancewith some example embodiments of the present disclosure.

DETAILED DESCRIPTION

Embodiments of the present disclosure will now be described more fullyhereinafter with reference to the accompanying drawings, in which some,but not all, embodiments of the present disclosure are shown. Indeed,embodiments of the present disclosure may be embodied in many differentforms, and should not be construed as limited to the embodiments setforth herein; rather, these embodiments are provided so that thedisclosure will satisfy applicable legal requirements. Like numbersrefer to like elements throughout.

Definitions

The term “sensor device” refers to an electrical configuration arrangedto measure a sensed value associated with a sensor environment, andoutput the measured sensed value via a sensor reading value. Examples ofsensed values include pressure, torque, motion, and/or force, as well asother sensed physical values. In some embodiments, a sensor device isassociated with one or more adjustable sensor parameters that can becalibrated to adjust a sensor reading value. In some embodiments, anexample sensor device includes at least a measuring bridge circuit and ashunt calibration circuit.

In some embodiments, a sensor device is associated with at least a“measuring mode” (or “operation mode”) and a “calibration mode.” Inmeasuring mode, a sensor device may detect a sensed value and, based onthe sense value, output a corresponding actual reading value. The actualreading value may be adjusted based on one or more parameter values forone or more adjustable sensor parameters.

In calibration mode, a sensor device may receive a simulated calibrationoutput and, based on the simulated calibration output, output acorresponding actual reading value. In calibration mode, a sensor lookuptable may be corrected, for example by generating a calibrated lookuptable to reflect calibrated reading values that are each associated witha corresponding simulated calibration output. Alternatively oradditionally, in calibration mode, one or more parameter values for oneor more adjustable sensor parameters may be set, for example byutilizing a calibration component. In some embodiments, the actualreading value output may be adjusted based on one or more parametervalues for one or more adjustable sensor parameters. It should beappreciated that, in some embodiments, the sensed value detected by asensor device may be ignored while in calibration mode.

The term “reading value” refers to an output associated with a sensordevice, where the output is based on, e.g., (1) a sensed value or (2) asimulated calibration output provided as input to the sensor device. Theterm “actual reading value” refers to an output provided by the sensordevice based on, e.g., (1) a sensed value or (2) a simulated calibrationoutput provided as input to the sensor device. In some embodiments, anactual reading value may be output to a sensor display associated withthe sensor device. The term “expected reading value” refers to a knownand/or calculated value that a sensor device is expected to produce ordisplay in response to a simulated calibration output having aparticular value. For example, in some embodiments, a sensor device mayinclude a non-transitory memory configured for storing expected readingvalues associated with various simulated calibration outputs. In someembodiments, one or more expected reading value(s) is/are utilized tocalibrate the sensor device to be within a calibration accuracy range.The term “calibrated reading value” refers to an output provided by thesensor device while in measuring mode that is adjusted based on one ormore calibrated sensor parameter values set for one or more calibrationsensor parameters. In some embodiments, a calibrated reading value maybe adjusted from an actual reading value based on one or more formulasthat utilize the calibrated sensor parameter values.

The term “output driver” refers to an electrical component, circuitry,hardware, software, or a combination thereof for transmitting asimulated calibration output to a sensor device to cause the sensordevice to output an actual reading value based on the simulatedcalibration output. An output driver receives an electrical signal fromanother component, and produces a corresponding simulated calibrationoutput. For example, in some embodiments, a digital-to-analog converteroutputs a converted calibration signal to an output driver as input. Inother embodiments, a filter component outputs a filtered calibrationsignal to an output driver as input. In some embodiments, the outputdriver may be component of a calibration component.

In some embodiments, an output driver may be a voltage output driver.For example, in some embodiments, an output driver configured to producesignals outputted at 0-5 volts, 0-10 volts, or ±10 volts. Alternativelyor additionally, an output driver may be a current output driver. Forexample, in some embodiments, an output driver configured to producesignals outputted at 4-20 mA.

The term “calibration command control” refers to an electricalcomponent, circuitry, hardware, software, or a combination thereof, thatoutputs a command control status signal to a multi-point shuntcalibration microcontroller. The command control status signal output bya calibration command control represents an input value utilized tocontrol the value output by the multi-point shunt calibrationmicrocontroller.

The term “calibration accuracy threshold” refers to a numerical value ofa maximum differential between an actual reading value and an expectedreading value for a sensor device to be considered accuratelycalibrated. In some embodiments, a sensor device may return to measuringmode after one or more adjustable sensor parameters are set tocorresponding calibrated sensor parameter values that cause one or moreactual values associated with one or more expected reading values to bewithin a calibration accuracy threshold.

The term “measuring bridge circuit” refers to a multi-branch electricalcircuit for measuring a sensed value based on an analog sensor input. Anexample of a measuring bridge circuit includes a Wheatstone bridge. Ameasuring bridge circuit is associated with a “shunt calibrationcircuit”, which refers to electrical circuitry for enabling shuntcalibration of the sensor device including the measuring bridge circuit.For example, an example shunt calibration circuit includes one or moreshunt resistors in parallel with one or more resistors of the measuringbridge circuit, where the shunt calibration resistors are associatedwith at least one shunt calibration switch for enabling shuntcalibration via the shunt resistors.

The term “calibration component” refers to a device, circuitry, module,software, or combination thereof, configured to output or cause outputof one or more simulated calibration outputs to a sensor device forperforming shunt calibration of the sensor device. In some embodiments,the calibration component may be connected to the sensor device. In someembodiments, the calibration component may be a sub-component of thesensor device. In some embodiments, each simulated calibration outputsmay be associated with an expected reading value for the sensor device.In some embodiments, a calibration component is configured to determinea calibrated sensor parameter value for one or more adjustable sensorparameters and/or set the calibrated sensor parameter value for one ormore adjustable sensor parameters. In some embodiments, a calibrationcomponent may include one or more sub-components for performing thevarious operations described.

The term “calibration mode management component” refers to a device,circuitry, module, software, or a combination thereof, communicable witha sensor device and configured to initialize calibration and/ordeinitialize calibration by setting a calibration mode associated withthe sensor device. In some embodiments, a calibration mode managementcomponent is a sub-component of a calibration component. A calibrationmode management component may output a “calibration initializationsignal” in response to activation of the calibration mode managementcomponent to set the sensor device into a calibration mode. Acalibration mode management component may output a “calibrationdeinitialization signal” in response to deactivation of the calibrationmode management component to set the sensor device into anoperating/measuring mode. Non-limiting examples of a calibration modemanagement component include a digital switch, an analog switch, a modetoggle button, or the like. In some embodiments, a calibration modemanagement component may be configured, for example by computer-codedinstructions, to automatically activate calibration mode (for example,by transmitting a calibration initialization signal) in response todetecting one or more predefined parameters or circumstances (forexample, may determine particular time of day/date, may detect sensevalue or actual reading value within a calibration activation range, andthe like). In some embodiments, a calibration mode management componentis embodied by a calibration switch or a calibration command control. Insome embodiments, a calibration mode management component is embodied bya multi-point shunt calibration microcontroller, or a multi-point shuntcalibration controller in conjunction with a calibration switch or acalibration command control.

The term “calibration controller component” refers to a device,circuitry, module, software, or a combination thereof, configured togenerate, determine a value for, or otherwise manage outputting of aplurality of simulated calibration outputs. In some embodiments, thecalibration controller component may be configured to manage outputtingof various simulated calibration outputs associated with a predefinedoutput sequence and/or one or more automatic output time shiftintervals. The calibration controller component may include one or moresubcomponents thereof to transmit a simulated calibration output to thesensor device to cause the sensor device to output a correspondingreading value. In some embodiments, the calibration controller componentmay include at least a multi-point shunt calibration circuit associatedwith a sensor device. In other embodiments, the calibration controllercomponent may include at least a multi-point shunt calibrationmicrocontroller associated with a sensor device. In some embodiments, acalibration controller component may include a filter component or adigital-to-analog converter, and an output driver.

The term “simulated calibration output” refers to an artificiallycontrolled electronic signal having a known value that is outputted froma calibration component, or a subcomponent thereof, to a sensor devicewhile the sensor device is in calibration mode. In some embodiments, asimulated calibration output may be associated with an actual readingvalue for a sensor device, such that the simulated calibration outputcauses the sensor device to output, and/or render to a display, theactual reading value. In some embodiments, the simulated calibrationoutput may be associated with an expected reading value for a sensordevice based on the known value of the simulated calibration output.Non-limiting examples of a simulated calibration output include avoltage, current, and/or other physical value as a percentage of fullscale associated with the sensor device or as an absolute value.

The term “representative calibration value” refers to an electricalsignal output by a multi-point shunt calibration microcontroller, whichcorresponds to a particular simulated calibration output. Arepresentative calibration value may be based on a command controlstatus signal or a switch status signal received as input to themulti-point shunt calibration microcontroller during calibration mode.In some embodiments, a calibration component (and/or a sub-componentthereof) may include another electrical component configured tointerpret the representative calibration value, for example an RC filteror a digital-to-analog converter. Examples of representative calibrationvalues include an “interpretable calibration value” and a “pulse widthmodulated calibration value”.

The term “interpretable calibration value” refers to a digital signaloutputted by a multi-point shunt calibration microcontroller, where thedigital signal represents a digital value using a binary representation.An interpretable calibration value has a known bit-length (for example,12-bits, 16-bits, 24-bits, or the like). In some embodiments, aninterpretable calibration value is outputted as serial data. In otherembodiments, an interpretable calibration value is outputted as paralleldata. An interpretable calibration value may be interpreted using aknown protocol, including but not limited to SPI, I2C, UART, and thelike. In some embodiments, an interpretable calibration value isoutputted to a digital-to-analog converter, which may receive theinterpretable calibration value and output a corresponding convertedcalibration signal.

The term “converted calibration signal” refers to an electrical signaloutput by a digital-to-analog converter transmitted to an output driver.In some embodiments, the converted calibration signal is a voltage.

The term “pulse width modulated calibration value” refers to anelectrical signal output by a multi-point shunt calibrationmicrocontroller, where the electrical signal represents a valueutilizing a fixed-frequency pulse train with pulses of varying widthinterpretable using a filter component (for example, a RC filter). Afilter component may receive a pulse width modulated calibration valueand output a corresponding filtered calibration signal.

The term “filtered calibration signal” refers to an output of a filtercomponent transmitted to an output driver. In some embodiments, a filtercalibration signal may represent a voltage.

The term “predefined output sequence” refers to a particular order ofsimulated calibration outputs outputted while in calibration mode, suchthat subsequent simulated calibration outputs in the predefined outputsequence are associated with different values. In some embodiments, apredefined output sequence may include increasing simulated calibrationoutputs between a lower boundary simulated calibration output and anupper boundary simulated calibration output. In other embodiments, apredefined output sequence may include decreasing simulated calibrationoutputs between an upper boundary simulated calibration output and alower boundary simulated calibration output. In other embodiments, apredefined output sequence includes a cycle of simulated calibrationoutputs, such that the simulated calibration outputs in a definedsequence begin and end at the same simulated calibration output. In someembodiments, a predefined output sequence may be repeated one, two,three, or more times (up to N times).

The term “automatic output shift time interval” refers to a length oftime that for which a simulated calibration output is output beforeautomatically changing to a different simulated calibration output in apredefined output sequence. An example calibration component may trackan “output time” that a particular simulated calibration output has beenoutputted for, and change to a different simulated calibration outputwhen the output time satisfies the automatic output shift time interval(e.g., when the output time exceeds the automatic output shift timeinterval, meaning sufficient time elapsed). In an example embodiment, acalibration component may change a presently outputted simulatedcalibration output by an automatic output step after the output time forthe presently outputted simulated calibration output satisfies automaticoutput shift time interval.

It should be appreciated that calibration components described hereinmay be capable of outputting a plurality of simulated calibrationoutputs at different values. For example, an example calibrationcomponent may be configured to output at least three simulatedcalibration outputs: an upper boundary simulated calibration output, alower boundary simulated calibration output, and an intermediatesimulated calibration output, each having a different value. In otherembodiments, a calibration component may output a boundary simulatedcalibration output (e.g., an upper boundary simulated calibration outputand a lower boundary simulated calibration output) and output any numberof intermediate simulated calibration outputs between the lower andupper boundary simulated calibration outputs. The term “initialcalibration output” refers to the first simulated calibration outputupon initialization of calibration mode. In some embodiments, theinitial calibration output may be a predefined simulated calibrationoutput having a specific value. In some embodiments, an initialcalibration output may be a lower boundary simulated calibration output,an upper boundary simulated calibration output, or an intermediatesimulated calibration output. For example, in some embodiments, theinitial calibration output is predefined as 0 percent of full scale.

In some embodiments, simulated calibration outputs are outputtedaccording to a predefined output sequence, where each simulatedcalibration output in the predefined output sequence is the output foran automatic output shift time interval (where the automatic outputshift time interval may be different for each simulated calibrationoutput, shared between some simulated calibration outputs, or the samefor each simulated calibration output). An example calibration componentmay output, or otherwise provide, an initial simulated calibrationoutput at any value between the lower and upper boundary simulatedcalibration outputs, or may be the lower boundary simulated calibrationoutput or upper boundary simulated calibration output. The calibrationcomponent may then continue outputting subsequent simulated calibrationoutputs according to a predefined output sequence. For example, somecalibration components output, or otherwise provide, an initialsimulated calibration output, such as a lower boundary simulatedcalibration output, and step up to provide various intermediatesimulated calibration outputs until the upper boundary simulatedcalibration output is reached. In some embodiments, the sequence endsupon reaching the upper boundary simulated calibration output. In otherembodiments, the sequence continues to then step down until the lowerboundary simulated calibration output is reached. In some embodiments,the sequence ends upon reaching the lower boundary simulated calibrationoutput. In other embodiments, an initial simulated calibration output isoutputted, such as an upper boundary simulated calibration output, thenthe sequence may step down until the lower boundary simulatedcalibration output is reached. In some embodiments, the sequence may endupon reaching the lower boundary simulated calibration output. In otherembodiments, the sequence may continue to step up until the upperboundary simulated calibration output is reached. In some embodiments,the sequence may end upon reaching the upper boundary simulatedcalibration output. In other embodiments, a predefined output sequencemay continue for any number of times (e.g., the predefined outputsequence may define a cycle that can be repeatedly outputted by acalibration component, or a subcomponent thereof). In some embodiments,the initial simulated calibration output may equal either the lowerboundary simulated calibration output or the upper boundary simulatedcalibration output.

The term “hold input” refers to one or more electrical componentsconfigured to cause continued output of a presently outputted simulatedcalibration output. For example, the presently outputted simulatedcalibration output may continue to be outputted for (1) a period oftime, (2) a predetermined duration, (3) as requested by an operator, ora combination thereof. In some embodiments, the hold input may beactivated to enable continued output of a simulated calibration output.In some embodiments, activation of a hold input may transmit a holdinitialization signal. In some embodiments, a hold input may bedeactivated to enable output of a next simulated calibration output in apredefined output sequence. In some embodiments, deactivation of a holdinput may transmit a hold cancellation signal. In some embodiments, apresently outputted simulated calibration output may be output from thetime a hold initialization signal is received until a hold cancellationsignal is received. Non-limiting examples of a hold input include ananalog hold switch and a digital hold switch.

The term “hold initialization signal” refers to a signal transmitted bya hold input to cause the calibration component to continue to output apresently outputted simulated calibration output currently being output.For example, the calibration component may continue to output apresently outputted simulated calibration output currently being outputfor (1) a period of time, (2) a predetermined duration, (3) as needed byan operator, or combinations thereof. In some embodiments, the holdinitialization signal may be an analog signal transmitted by an analoghold switch. In other embodiments, the hold initialization signal may bea digital signal transmitted by a digital hold switch.

The term “hold cancellation signal” refers to a signal transmitted by ahold input to cause the calibration component to stop outputting thepresently outputted simulated calibration output and return to apredefined output sequence. In some embodiments, the hold cancellationsignal may be an analog signal transmitted by an analog hold switch. Inother embodiments, the hold cancellation signal may be a digital signaltransmitted by a digital hold switch.

The term “adjustable sensor parameter” refers to a factor associatedwith a sensor device, which can be changed during calibration mode toaffect a sensed value that is output by a sensor device in measuringmode. An adjustable sensor parameter is associated with a “parametervalue” that represents the numerical value of the adjustable sensorparameter at a given time. In some embodiments, a parameter value for anadjustable sensor parameter may be set in a digital manner, for exampleby storing the parameter value for the adjustable sensor parameter in anon-volatile memory associated with the sensor device such that theparameter value may be retrieved and utilized by the sensor in measuringmode. In other embodiments, a parameter value for an adjustable sensorparameter may be set in an analog manner, for example by altering one ormore components of a calibration circuit (e.g., modifying one or moreresistances). Non-limiting examples of adjustable sensor parametersinclude gain, balance, and/or zero.

The term “sensor adjustment component” refers to a physical device,component, circuitry, module, software, or a combination thereof, forsetting a parameter value for an adjustable sensor parameter associatedwith a sensor device. In some embodiments, a sensor adjustment componentmay be embodied by devices, hardware, circuitry, software, or acombination thereof for determining a parameter value for at least oneadjustable sensor parameter, and/or setting a parameter value for the atleast one adjustable sensor parameter. For example, in some embodiments,a sensor adjustment component may include a processor associated with amemory having computer-coded instructions therein for performing theoperations described herein. In some embodiments, a sensor adjustmentcomponent may include one or more adjustment knobs, wheels, or otherdevices for setting a physical position associated with a correspondingparameter value for an adjustable sensor parameter, in response to userengagement by an operator.

The term “calibrated sensor parameter value” refers to a particularparameter value for an adjustable sensor parameter to achieve, for agiven sensed value, simulated calibration output, percentage of fullscale, or the like, an actual reading value for a sensor device that iscalibrated to be within a calibration accuracy range. A calibratedsensor parameter value is set by, or utilizing, a sensor adjustmentcomponent. In some embodiments, a calibrated sensor parameter value maybe calculated and/or determined automatically, for example by a device,hardware, circuitry, software, or a combination thereof. In otherembodiments, a calibrated sensor parameter value is received via asensor adjustment component configured for user engagement.

Overview

Calibrating a sensor device may allow for improved accuracy of thesensor device while in a measuring mode. A sensor device that isuncalibrated, poorly calibrated, or inaccurately calibrated may be morelikely to output an inaccurate reading value for one or more sensedvalues. Various sensor devices, such as analog pressure, load, andtorque sensors, may be configured using hardware and/or software toimplement shunt calibration. Shunt calibration may improve the accuracyof a sensor device by causing the sensor device to output a readingvalue based on a simulated calibration output. The simulated calibrationoutput may, for example, be a certain percentage of full scale or span,such that the simulated calibration output is associated with a known,expected reading value for the sensor device.

In some embodiments, each simulated calibration output is associatedwith an actual reading value for the sensor device and an expectedreading value for the sensor device. When the sensor device is notcalibrated, the actual reading value and the expected reading value maydiffer, such that the difference exceeds a desired calibration accuracythreshold. The expected reading value and the actual reading valueassociated with the simulated calibration output may differ due toerrors introduced in the signal chain between the sensor device and anend user system (for example, a database or a user interface fordisplaying the actual reading value). Such errors include non-linearity,hysteresis, zero, dead band, and gain errors associated with the signalchain or data acquisition chain. Uncalibrated sensor devices, and sensordevices calibrated utilizing traditional shunt calibration, mayinsufficiently address such errors.

Using multi-point shunt calibration, as described herein, the sensordevice may be calibrated based on multiple simulated calibrationoutputs, including one or more intermediate simulated calibrationoutputs, where each simulated calibration output is associated with anactual reading value and an expected reading value. Based on themultiple actual reading values and/or multiple expected reading valuesassociated with the various simulated calibration outputs issues thatarise with respect to accurately producing, displaying, or otherwiseoutputting an actual reading value from a sensor device based on asensed value, for example errors introduced via the signal and/or dataacquisition chain such as non-linearity, dead zone, hysteresis, zero,and gain errors associated with the sensor device may be detected andaccounted for. Based on the multiple actual reading values and/ormultiple expected reading values associated with the various simulatedcalibration outputs, the sensor device may be calibrated to accuratelyaddress detected errors. For example, rather than calibrating the sensordevice based on a single simulated calibration output and acorresponding actual reading value and/or a corresponding expectedreading value for the sensor device, or based on two simulatedcalibration outputs (e.g., 0% and some percentage of full scale) and twocorresponding actual reading values and/or two corresponding expectedreading values, the sensor device, utilizing the disclosed multi-pointshunt calibration methods, may calibrate the sensor over an operatingrange (e.g., a full operating scale associated with the sensor device)to detect and account for errors that may arise when the sensor deviceis operating within the operating range. Utilizing multi-point shuntcalibration, the sensor device may provide a calibrated reading valuethat takes into account errors found in the signal chain throughout theoperating range of the sensor device. The calibrated reading value maythereby provide a more accurate reading of the sensed condition.

In some embodiments, one or more calibrated sensor parameter values maybe set for one or more adjustable sensor parameters, for example foradjusting actual reading values in measuring mode based on thecalibrated sensor values for the full scale of the sensor device.Setting the calibrated sensor values based on the first, second, andthird actual reading values may enable improved adjustment of actualreading values to account for non-linear issues, for example using apredefined formula or calibrated lookup table to adjust a calibratedreading value produced by a sensor device across the full scale for thesensor device. Any number of intermediate simulated calibration outputsmay be utilized to calibrate the sensor device to produce calibratedreading values within a desired accuracy level.

Multi-point shunt calibration may also be utilized to identify issuesassociated with a sensor device or subcomponents thereof. For example,multi-point shunt calibration may be utilized to identify problemsassociated with hysteresis, non-linearity, or other issues based on thephysical construction and/or state of components of the sensor device.Multi-point shunt calibration may enable identifying that such issuesaffect the accuracy of the sensor device sufficiently such that thesensor device is not within a desired accuracy, and thus the sensorrequires new components and/or component maintenance to improveaccuracy.

In some embodiments, an appropriate simulated calibration output isoutputted in a predefined output sequence based on a predefined outputsequence. In some embodiments, each simulated calibration output may beoutputted (or in other words be produced as the output) for the lengthof time defined by the automatic output time shift interval, after whicha different simulated calibration output may be outputted. For example,where the multiple calibration outputs are associated with a predefinedoutput sequence, each simulated calibration output may be associatedwith another simulated calibration output that follows next in thepredefined output sequence. The differences between the multiplesimulated calibration outputs may be associated with an output stepsize, such that each simulated calibration output differs from the nextsimulated calibration output in the predefined output sequence by theoutput step size, where the output step size is the same or differentbetween each adjacent simulated calibration output. Some embodimentsinclude a multi-point shunt calibration microcontroller configured tooutput an appropriate simulated calibration output of a plurality ofpossible simulated calibration outputs using time division multiplexing(e.g., for example, with an automatic output shift time interval of 1second, 5 seconds, 10 seconds, and the like).

In some embodiments, the output step size between simulated calibrationoutputs associated with a predefined output sequence may be equalbetween all simulated calibration outputs (e.g., a first intermediatesimulated calibration output is 1 step size away from a secondintermediate simulated calibration output, 2 step sizes away from athird intermediate simulated calibration output, 3 step sizes away froma fourth intermediated calibration output, and so on). In otherembodiments, the output step size between simulated calibration outputsmay be non-uniform, such that the step size between some simulatedcalibration outputs is larger than the step size between some othersimulated calibration outputs. For example, in one example embodiment,the step size between a first intermediate simulated calibration outputand a second intermediate simulated calibration output may be lower thanthe step size between the second intermediate simulated calibrationoutput and a third intermediate simulated calibration output. It shouldbe appreciated that the step size between an intermediate simulatedcalibration output and a boundary simulated calibration output may bedifferent from the step sizes between intermediate simulated calibrationoutputs. In some embodiments, for example, the output step size mayincrease by a set value, or by a percentage value, each step up (or eachstep down) in a predefined output sequence. In other embodiments, apredefined output sequence may be associated with a step size set, whichdefines the one or more output step sizes between the various simulatedcalibration outputs associated with the predefined output sequence. Theoutput step sizes in the step size set may be non-uniform or uniform.

Similarly, in some embodiments, the automatic time shift intervalassociated with each simulated calibration output associated with apredefined output sequence may be equal for each simulated calibrationoutput in the predefined output sequence. For example, in someembodiments, each simulated calibration output may be outputted for thesame automatic output time shift interval (e.g., 1 second, 2 seconds, 5seconds, 10 seconds, or the like). In other embodiments, the automaticoutput time shift interval for each simulated calibration output may bedifferent for certain, or each, simulated calibration output in apredefined output sequence. In some embodiments, the automatic outputcalibration time shift interval may increase (or decrease) by a setvalue for each simulated calibration output in the predefined outputsequence. In other embodiments, a predefined output sequence may beassociated with an output shift interval set including an automaticoutput time shift interval associated with each simulated calibrationoutput in the predefined output sequence. In an example embodiment, anexample predefined output sequence may be associated with an outputshift interval set such that a lower boundary simulated calibrationoutput is outputted for a first automatic output time shift interval(e.g., 1 second), a first intermediate simulated calibration output isoutputted for a second automatic output time shift interval (e.g., 2seconds), a third intermediate simulated calibration output is outputtedfor a third automatic output time shift interval (e.g., 5 seconds) andso on. In some embodiments, one or more of the automatic output timeshift intervals in the output shift interval set may be equal.

In other embodiments, the value associated with simulated calibrationoutputs may be controlled manually by a user. For example, someembodiments include a single shunt initialization component for settingone or more calibration value inputs, where the shunt initializationcomponent may be set to various levels, each level associated with adifferent simulated calibration output (e.g., a first level for settinga first calibration value input associated with a simulated calibrationoutput of −10 volts, a second level for setting a first and a secondcalibration value inputs associated with a simulated calibration outputof −5 volts, a third level for setting a first, a second, and a thirdcalibration value inputs associated with a simulated calibration outputof 0 volts, and so on). Alternatively, in some embodiments, a shuntinitialization component may include various calibration value switchesfor setting the various calibration value inputs.

A sensor device is associated with one or more adjustable sensorparameters that may be adjusted to calibrate the sensor device. Forexample, adjustable sensor parameters for a particular sensor device mayinclude span, balance, zero, and/or the like. Each adjustable sensorparameter may be set to a sensor parameter value, which affects theactual reading value output by the sensor device for various inputs.

Embodiments of the present disclosure thus provide many advantages.Embodiments enable accurate calibration of sensor devices usingmulti-point shunt calibration. Additionally, specific embodiments enablea user and/or calibration system to detect and/or address non-linearity,hysteresis, dead band, zero, and gain errors associated with the signalchain and/or data acquisition chain. Embodiments thus enable shuntcalibration with increased accuracy that accounts for such errors.

Examples of Multi-Point Shunt Calibration Apparatuses

The methods, apparatuses, systems, and computer program products of thepresent disclosure may be embodied by any variety of devices. Forexample, a method, apparatus, system, and computer program product of anexample embodiment may be embodied by a multi-point shunt apparatusincluding a calibration component associated with a sensor device and asensor adjustment component. Example embodiments may include acombination of analog and digital circuitry.

FIG. 1 shows a schematic block diagram of circuitry 10, which may beincluded in, for example, a sensor device, a calibration component (ordevice), and/or the like, or a combination thereof. A sensor device,calibration component, may include one or more components of thecircuitry 10, and may be configured to, either independently or jointly,and/or with other devices via a network, perform the functions describedherein. As illustrated in FIG. 1 , in accordance with some exampleembodiments, circuitry 10 can include various means, such as processor12, memory 14, communications module 16, I/O module 18, multi-pointshunt calibration system 22, and/or multi-point shunt calibrationdatabase 24. As referred to herein, “block”, “module”, and “circuitry”includes hardware, software, and/or firmware configured to perform oneor more particular functions. In this regard, the means of circuitry 10as described herein may be embodied as, for example, circuitry, hardwareelements (e.g., one or more suitably programmed processor,microprocessor, combinational logic circuit, and/or the like), acomputer program product comprising computer-readable programinstructions stored no a non-transitory computer-readable medium (e.g.,memory 14) that is executable by a suitably configured processing device(e.g., processor 12), or some combination thereof.

Processor 12 may, for example, be embodied as various means includingone or more microprocessor with accompanying digital processor(s), oneor more microprocessors with accompanying digital signal processor(s),one or more processor(s) without an accompanying digital signalprocessor, one or more coprocessors, one or more multi-core processors,one or more controllers, processing circuitry, one or more computers,various other processing elements including integrated circuits such as,for example, an ASIC (application specific integrated circuit) or FPGA(field programmable gate array), or some combination thereof.Accordingly, although illustrated in FIG. 1 as a single processor, insome embodiments processor 12 comprises a plurality of processors. Theplurality of processors may be embodied on a sensor, calibrationcomponent, server, or may be distributed across a plurality of devicescollectively configured to function as circuitry 10. The plurality ofprocessors may be in operative communication with each other and may becollectively configured to perform one or more functionalities ofcircuitry 10 as described herein. In an example embodiment, processor 12is configured to execute instructions stored in memory 14, or otherwiseaccessible to the processor 12. These instructions, when executed byprocessor 12, may cause circuitry 10 to perform one or more of thefunctionalities of circuitry 10 as described herein.

Whether configured by hardware, firmware/software methods, or by acombination thereof, processor 12 may comprise an entity capable ofperforming operations according to embodiments of the present disclosurewhen configured accordingly. Thus, for example, when processor 12 isembodied as an ASIC, FPGA, or the like, processor 12 may comprisespecifically configured hardware for conducting one or more operationsdescribed herein. Alternatively, as another example, when processor 12is embodied as an executor of instructions, such as may be stored in thememory 14, the instructions may specifically configure processor 12 toperform one or more formula and operations described herein, such asthose discussed in connection with FIGS. 7 and 8 .

Memory 14 may comprise, for example, volatile memory, non-volatilememory, or some combination thereof. Although illustrated in FIG. 1 as asingle memory, memory 14 may comprise a plurality of memory components.The plurality of memory components may be embodied on a single sensordevice, calibration component, server, and/or a combination thereof, ora distributed across a plurality of such devices. In variousembodiments, memory 14 may comprise, for example, a hard disk, randomaccess memory, cache memory, flash memory, a compact disc read onlymemory (CD-ROM), digital versatile disc read only memory (DVD-ROM), anoptical disc, circuitry configured to store information, or somecombination thereof. Memory 14 may be configured to store information,data (including data discussed with regards to the multi-point shuntcalibration database 24), applications, instructions, or the like forenabling circuitry 10 to carry out various functions in accordance withexample embodiments of the present disclosure. For example, in at leastsome embodiments, memory 14 is configured to store a parameter value forone or more adjustable sensor parameters. Additionally or alternatively,in at least some embodiments, memory 14 is configured to store programinstructions for execution by processor 12. Memory 14 may storeinformation in the form of static and/or dynamic information. Thisstored information may be stored and/or used by circuitry 10 during thecourse of performing its functionalities.

Communications module 16 may be embodied as any device or means embodiedin circuitry, hardware, a computer program product comprising computerreadable program instructions stored on a computer readable medium(e.g., memory 14) and executed by a processing device (e.g., processor12), or a combination thereof that is configured to receive and/ortransmit data from/to another device and/or network, such as, forexample, a sensor device, calibration component, sensor adjustmentcomponent, or other device/component associated with circuitry 10,and/or the like. In some embodiments, communications module 16 (likeother components discussed herein) can be at least partially embodied asor otherwise controlled by processor 12. In this regard, communicationsmodule 16 may be in communication with processor 12, such as via a bus.Communications module 16 may include, for example, an antenna, atransmitter, a receiver, a transceiver, network interface card and/orsupporting hardware and/or firmware/software for enabling communicationswith another device of circuitry 10. Communications module 16 may beconfigured to receive and/or transmit any data that may be stored bymemory 14 using any protocol that may be used for communications betweendevices and/or components, such as a sensor device, calibrationcomponent, server, and the like. Communications module 16 mayadditionally or alternatively be in communication with the memory 14,I/O module 18 and/or any other component of circuitry 10, such as via abus.

Circuitry 10 may include input/output (I/O) module 18 in someembodiments. I/O module 18 may be in communication with processor 12 toreceive an indication of a user input and/or to provide an audible,visual, mechanical, or other output to a user. As such, I/O module 18may include support, for example, for a keyboard, digital inputs, analoginputs, a mouse, a joystick, a sensor display, a calibration componentdisplay, a touch screen display, a microphone, a speaker, a RFID reader,barcode reader, biometric scanner, and/or other input/output mechanisms.In embodiments wherein circuitry 10 is embodied as at least a server ordatabase, aspects of I/O module 18 may be reduced as compared toembodiments where circuitry 10 is implemented as an end-user machine orother type of device designed for complex user interactions (e.g., asensor device and/or calibration component). In some embodiments (likeother components discussed herein), I/O module 18 may even be eliminatedfrom circuitry 10. Alternatively, such as in embodiments whereincircuitry 10 is embodied as a server or database, at least some aspectsof input/output module 18 may be embodied on an apparatus used by a userthat is in communication with circuitry 10. I/O module 18 may be incommunication with the memory 14, communications module 16, and/or anyother component(s), such as via a bus. One or more than one I/O moduleand/or other component can be included in circuitry 10.

Circuitry 10 may include multi-point shunt calibration system 22 in someembodiments. Multi-point shunt calibration system 22 may be incommunication with processor 12 and/or one or more other modules, tooutput one or more simulated calibration outputs to a sensor device,and/or cause displaying of an actual reading value associated with thesimulated calibration output to a display of the sensor device. Themulti-point shunt calibration system 22 may, utilizing one or more ofthe I/O module 18, processor 12, or the like, detect and/or store anactual reading value associated with a simulated calibration outputbeing outputted. Additionally or alternatively, the multi-point shuntcalibration system 22 may determine a calibrated sensor parameter valuefor one or more adjustable sensor parameters, for example based on anactual reading value and an expected reading value for various simulatedcalibration outputs. In this way, the multi-point shunt calibrationsystem 22 may support multiple formulas, algorithms, or the like fordetermining a calibrated reading value, the calibrated sensor parametervalue for one or more adjustable sensor parameters, and/or communicatewith processor 12 and/or memory 14 to execute instructions forperforming the formula(s). The multi-point shunt calibration system 22may set the calibrated sensor parameter value for one or more adjustablesensor parameters, for example by communicating with the multi-pointshunt calibration database 24 and/or memory 14.

Circuitry 10 may also include multi-point shunt calibration database 24.In some embodiments, the multi-point shunt calibration database 24 maybe provided that includes parameter values for one or more adjustablesensor parameters for a sensor device. The multi-point shunt calibrationdatabase 24 may be accessed, for example utilizing processor 12, toretrieve the parameter values for the one or more adjustable sensorparameters to adjust an actual reading value based on the one or moreparameter values to produce a calibrated reading value. The multi-pointshunt calibration system 22 may communicate with the multi-point shuntcalibration database 24 to store calibrated sensor parameter values forthe adjustable sensor parameters during multi-point shunt calibration.In some embodiments, the multi-point shunt calibration database 24 maygenerate and/or store a lookup table for determining calibrated sensorvalues based on sensed values.

Circuitry 10 may be embodied by one or more devices and/or componentsforming a sensor device, calibration component, and/or multi-point shuntcalibration apparatus, such as the apparatus 100 illustrated in FIG. 2 .As illustrated in FIG. 2 , the apparatus 100 may include a sensor device102, calibration component 108, and a sensor adjustment component 114.It should be appreciated that each of the sensor device 102, calibrationcomponent 108, and sensor adjustment component 114 may be embodied usinga myriad of subcomponents, as will be described further below. Theapparatus 100 may be configured to perform the operations describedusing one or more of the components 102, 108, and 114, and/or one ormore of the subcomponents therein.

The sensor device 102 includes circuitry, components, modules, and/or acombination thereof, for measuring a sensed value based on a sensorinput associated with a sensor environment, and to output a readingvalue associated with the sensed value. The sensor device 102 maymeasure the sensed value based on the sensor input while in a measuring(or operating) mode. In some embodiments, a sensor device includes ameasuring bridge component 104 configured for converting an analogsensor input into a sensed value associated with an actual readingvalue. For example, the measuring bridge component 104 may receive ananalog sensor input from an electrical transducer (not shown), andconvert the sensor input into a corresponding sensed value thatrepresents the analog sensor input.

The sensed value output by the measuring bridge component 104 may beadjusted based on one or more adjustable sensor parameters to accountfor errors, such as those introduced in the signal chain and/or dataacquisition chain. In some embodiments, the adjustable sensor parametersalter the physical properties associated with circuitry and/orsubcomponents of the measuring bridge component 104. In otherembodiments, the adjustable sensor parameters may be stored in anon-volatile memory associated with the sensor device 102, and/orassociated with the sensor adjustment component 114.

The calibration component 108 includes circuitry and/or other hardwarefor initializing and/or performing calibration of the sensor device 102.The calibration component 108 may be configured to communicate withsensor device 102 and/or sensor adjustment component 114 to initializeand/or perform calibration of the sensor device 102.

For example, in an example embodiment, the calibration component 108 mayinclude a calibration mode management component 110. The calibrationmode management component 110 may include circuitry, hardware, and/orthe like to toggle the sensor device 102 between a measuring mode and acalibration mode. For example, the calibration mode management component110 may include a shunt calibration switch (e.g., an analog switch ordigital switch), dial, or similar input component, foractivating/deactivating the calibration mode.

In some embodiments, the user may activate a calibration mode managementcomponent 110, or a sub-component thereof, to cause transmission of thecalibration initialization signal. In other embodiments, the calibrationmode management component 110 may activate calibration modeautomatically and automatically transmit a corresponding calibrationinitialization signal. For example, in some embodiments, the calibrationmode management component 110 may detect, for example using one or morespecially configured hardware and/or software, circuitry, and/or thelike, that calibration mode should be initialized based on an actualreading value, a sensed value, and/or another factor. In yet otherembodiments, a calibration mode management component 110 may transmit acalibration initialization signal automatically at determined and/orpredetermined interval (e.g., once a day, once a month, once a year,after a predetermined number of readings, and the like).

The calibration mode management component 110 may receive a calibrationinitialization signal when calibration mode is activated via thecalibration mode management component. The calibration initializationsignal may include a digital initialization signal. For example, in someembodiments, the calibration initialization signal indicates that thesensor device should be set to calibration mode, and may be used to setone or more calibration value inputs associated with the simulatedcalibration output of the apparatus. For example, in some embodiments,the calibration initialization signal may be above a calibrationthreshold, and the value of the calibration initialization signal maycontrol be determine one or more inputs to a multi-point shuntcalibration circuit and/or multi-point shunt calibrationmicrocontroller. The calibration initialization signal may include ananalog initialization signal. For example, in some embodiments, thecalibration initialization signal is a voltage associated with settingthe sensor device 102 to calibration mode, and/or associated withsetting one or more calibration value inputs associated with acorresponding multi-point shunt calibration circuit and, thus, determinethe simulated calibration output.

The calibration mode management component may receive a calibrationdeinitialization signal when calibration mode is deactivated, forexample via the calibration mode management component. The calibrationdeinitialization signal may include a digital deinitialization signal.For example, in some embodiments, the calibration deinitializationsignal indicates that the sensor device should return to anoperational/measuring mode. The calibration deinitialization signal mayinclude an analog deinitialization signal. For example, in someembodiments, the calibration deinitialization signal is a voltageassociated with deactivating calibration mode and setting the sensordevice 102 to an operating/measuring mode.

The calibration mode management component 110 may include circuitry,hardware, or the like for activating the shunt calibration component 106associated with the sensor device 102. The shunt calibration component106 includes circuitry, hardware, software, or a combination thereof foractivating shunt calibration mode for the sensor device 102.Additionally or alternatively, the shunt calibration component 106includes circuitry, hardware, software, or a combination thereof foroutputting an artificial, simulated calibration output to the sensordevice 102. For example, shunt calibration component 106 may includehardware that, when the sensor device 102 is set to calibration mode,bypasses the input of the measuring bridge component 104 and insteadutilizes a simulated calibration output as input. Thus, using the shuntcalibration component 106, the sensor device 102 may output an actualreading value associated with a simulated calibration output rather thanan actual reading value associated with a sensed value (for example,resulting from an actual force applied to a force sensor, a pressureapplied to a pressure sensor, and the like).

The shunt calibration component 106 may include means, such as hardware,circuitry, software, or a combination thereof, for setting one or morecalibrated sensor parameter values for one or more adjustable sensorparameters associated with the sensor device 102. In some embodiments,the shunt calibration component 106 may include or be associated with anon-transitory memory for storing the one or more calibrated sensorparameter values while in calibration mode. For example, the sensordevice 102 may receive the at least one calibrated sensor parametervalue from the calibration component 108 via shunt calibration component106. When the sensor device 102 is in measuring mode, the shuntcalibration component 106 may access the calibrated parameter values,for example by retrieving them from the non-volatile memory, for use inproducing a calibrated reading value for the sensor device 102. Forexample, in some embodiments, an actual reading value associated with asensed value (e.g., an actual reading value determined by the sensordevice 102 utilizing the measuring bridge component 104) may be adjustedutilizing the calibrated sensor parameter value(s) for one or moreadjustable sensor parameters to produce the calibrated reading value.

Calibration controller component 112 includes circuitry, hardware, orthe like for determining and/or outputting various simulated calibrationoutputs to the sensor device 102 while in calibration mode. Thecalibration controller component 112 may transmit the simulatedcalibration output to the shunt calibration component 106 of the sensordevice 102, causing the sensor device 102 to output an actual readingvalue based on the simulated calibration output from the calibrationcontroller component 112.

The calibration controller component 112 is configured to output varioussimulated calibration outputs, each associated with a different expectedreading value. For example, the calibration controller component isconfigured to output various simulated calibration outputs thatrepresent different percentages of full scale associated with the sensordevice 102. The calibration controller component may output at least onelower boundary simulated calibration output (e.g., representative of 0%of full scale), one upper boundary simulated calibration output (e.g.,representative of 100% of full scale), and at least one intermediatesimulated calibration output (e.g., representative of 50% of fullscale). Accordingly, the calibration controller component is configuredto facilitate multi-point shunt calibration as described further herein.

In some embodiments, the calibration controller component 112 isconfigured to provide, by outputting, a particular simulated calibrationoutput for an automatic output shift time interval. After the automaticoutput shift time interval elapses, a second simulated calibrationoutput may be outputted, where the second simulated calibration outputis at a different value. The calibration controller component 112 mayinclude timing circuitry and/or components for tracking an output timeassociated with the currently provided simulated calibration output.

In some embodiments, the calibration controller component 112 receivesone or more calibration input values, such as control signals and/oranalog signals that are set by one or more input controls, which areutilized to determine the simulated calibration output to be outputtedto the sensor device 102. For example, the calibration controllercomponent 112 may receive various input values based on a digital inputprovided by a user or determined by the calibration controller component112 itself, or another module, indicating a desired simulatedcalibration output. Alternatively, the calibration controller component112 may receive various input values based on an analog setting of amulti-value input component (such as a dial, for example) thatcorresponds to a desired calibration output.

The calibration controller component may include a multi-point shuntcalibration microcontroller. The calibration controller component mayinclude additional hardware, circuitry, or other components forinitializing the multi-point shunt calibration microcontroller for shuntcalibration and/or controlling the multi-point shunt calibrationmicrocontroller (for example, a calibration command control or acalibration switch). Additionally or alternatively, the calibrationcontroller component may include additional hardware, components, and/orcircuitry for further processing the output of the multi-point shuntcalibration microcontroller into a corresponding simulated calibrationoutput. The multi-point shunt calibration microcontroller may beconfigured, using computer-coded instructions, to perform one or moreoperations described herein.

In some embodiments, the calibration controller component 112 includes ahold input for maintaining the particular simulated calibration outputfor a defined period of time, or until a further signal is received. Forexample, the hold input may be embodied by a hold analog switch, a holddigital switch, a hold toggle button, or similar hardware component. Thehold input may be configured to transmit a hold initialization signalwhen activated. The hold input may be configured to transmit a holddeinitialization signal when deactivated.

The calibration controller component 112 may include a multi-point shuntcalibration circuit specially configured for outputting a simulatedcalibration output based on one or more calibration input values. Forexample, in some embodiments, one or more digital or analog calibrationinput values is received from a component of circuitry 10, and asimulated calibration output is outputted from the multi-point shuntcalibration circuit based on a circuit resistance for the multi-pointshunt calibration circuit. The circuit resistance may change based onthe one or more calibration input values, for example where eachcalibration input value is associated with an output adjustment switchfor connecting one or more resistors in parallel, thus adjusting theoverall circuit resistance. In some embodiments, an output adjustmentswitch is a hardware component that, based on a correspondingcalibration input value, alters a physical property of a multi-pointshunt calibration circuit to alter the simulated calibration output thatis outputted by the multi-point shunt calibration circuit. For example,a first output adjustment switch may be associated with a firstcalibration input value, such that when the first calibration inputvalue is active (e.g., above a predefined threshold), the first outputadjustment switch is toggled to include a first resistor in amulti-point shunt calibration circuit. It should be appreciated that, inother embodiments, alternative components may be used to alter physicalproperties of the multi-point shunt calibration circuit (e.g., voltage,current, resistance, and the like).

Sensor adjustment component 114 includes hardware, circuitry, or thelike for determining, and/or setting and maintaining one or moreadjustable sensor parameters for the sensor device 102. The sensoradjustment component 114 includes adjustment determination component116. In some embodiments, the adjustment determination componentgenerates, calculates, and/or otherwise determines a calibrated sensorparameter value for one or more adjustable sensor parameters associatedwith the sensor device 102 while the sensor device 102 is in calibrationmode. For example, when the sensor device 102 is set to calibrationmode, the adjustment determination component 116 may be configured toreceive, and/or identify, an actual reading value output by the sensordevice 102 for a given simulated calibration output. For example, theadjustment determination component 116 may read the actual reading valueproduced by the sensor device 102, or receive an input signalrepresenting the actual reading value produced by the sensor device 102.In some embodiments, the adjustment determination component 116determines one or more calibrated parameter value(s) for a particularadjustable sensor parameter utilizing one or more formulas. Theadjustment determination component 116 may include circuitry, includinga memory having computer-coded instructions therein and a processor, forperforming the formulas for determining the calibrated sensor parametervalue(s). For example, the adjustment determination component 116 may beassociated with one or more components of the circuitry 10, such as theprocessor 12 and/or memory 14. The adjustment determination component116 may determine a calibration error associated with the sensor deviceusing an actual reading value, and the corresponding simulatedcalibration output and/or an expected reading value for thecorresponding simulated calibration output. In some example embodiments,the adjustment determination component may retrieve, calculate, orotherwise determine an expected reading value for the simulatedcalibration output, and determine the calibration error using the actualreading value for the simulated calibration output and the expectedreading value for the simulated calibration output.

The adjustment determination component 116 may track multiplecalibration errors for multiple simulated calibration outputs utilizedduring multi-point shunt calibration as described herein. For example,each simulated calibration output may be associated with a calibrationerror that represents a difference between the expected reading valueand the actual reading value output by the sensor device 102. Theadjustment determination component 116 may generate, calculate and/orotherwise determine one or more calibrated sensor parameter values forone or more adjustable sensor parameter(s) associated with the sensordevice 102 based on the various calibration errors associated with thevarious simulated calibration outputs.

In some embodiments, the adjustment determination component 116 may beconfigured to generate, determine, and/or calculate, a calibrated sensorparameter value for one or more adjustable sensor parameters utilizingone or more formulas. For example, the adjustment determinationcomponent 116 may be embodied by the circuitry 10, or one or moresub-components thereof, and utilize the processor 12, memory 14, and/ormulti-point shunt calibration system 22 to execute one or more formulasfor generating, determining, and/or calculating a calibrated sensorparameter value for one or more adjustable sensor parameters. In someembodiments, the multi-point shunt calibration database 24 may beaccessed to retrieve instructions and/or formula information forgenerating, determining, and/or calculating the various calibratedsensor parameter values for the various adjustable sensor parameters.

In some embodiments, the adjustment determination component 116 may beconfigured to identify and/or utilize one or more predefined formulasfor determining one or more calibrated parameter value(s) for one ormore adjustable sensor parameters. For example, the adjustmentdetermination component 116 may retrieve instructions for performing thepredefined formula. In a particular example embodiment, the adjustmentdetermination component 116 may determine at least one calibrated sensorparameter value for a terminal based non-linearity parameter at apercentage of full scale, where the calibrated sensor parameter value isbased on the following formula, which represents a particular parametervalue formula. The adjustment determination component 116 may includecircuitry for identifying, retrieving and executing instructions forperforming the particular formula(s), for example utilizing theprocessor 12, memory 14, and/or multi-point shunt calibration system 22of the circuitry 10:

${{Terminal}{Based}{{NonLinearity}\left\lbrack {\%{of}{Full}{Scale}} \right\rbrack}} = \frac{\left( {{{Sensor}{Output}{at}50\%} - \frac{\begin{matrix}{{{Sensor}{Output}{at}0\%} +} \\{{Sensor}{Output}{at}{}100\%}\end{matrix}}{2}} \right)*100}{{{Sensor}{Output}{at}100\%} - {{Sensor}{Output}{at}0\%}}$

In some embodiments, multiple calibrated sensor parameter value(s) areset, each set associated with a simulated calibration output, an actualreading value, and/or an expected reading value (e.g., a percentage offull scale). The calibrated sensor parameter value(s) for the terminalbased non-linearity parameter may be utilized to detect and, if needed,correct a non-linearity error associated with the sensor device. Forexample, based on the calibrated sensor parameter value(s) for thenon-linearity parameter, a higher order polynomial may be used to adjustthe actual reading value provided by the sensor device to produce acalibrated reading value. Alternatively, in some embodiments, thecalibrated sensor parameter value(s) for the non-linearity calibratedparameter (and/or calibrated sensor parameter value(s) for otheradjustable sensor parameters) may be used to define a calibrated lookuptable between 0% and 100% range of full scale, which may be utilized tocorrect one or more errors associated with the sensor device anddetermine/produce calibrated reading values when the sensor device is inmeasuring mode.

Additionally or alternatively, for example, the adjustment determinationcomponent 116 may determine at least one calibrated sensor parametervalue for a hysteresis parameter. For example, the calibrated sensorparameter value(s) for the hysteresis parameter may be based on one ormore of the actual reading values and/or expected reading values atdifferent points in a predefined output sequence. For example, aplurality of simulated calibration outputs may be outputted while goingup a particular predefined output sequence (e.g., 0% to 25%, to 50%, to75%, to 100%) and associated with various actual reading values, and aplurality of simulated calibration output may be outputted while goingdown the particular predefined output sequence (e.g., 100% to 75%, to50%, to 25%, to 0%) and associated with various actual reading valuesoutputted by the sensor device, such that an adjustable sensorparameters may be determined based on the following formula, whichrepresents a particular formula. The adjustment determination component116 may include circuitry for identifying, retrieving and executinginstructions for performing the formula or formulas, for exampleutilizing the processor 12, memory 14, and/or multi-point shuntcalibration system 22 of the circuitry 10:

${{Hysteresis}\left\lbrack {\%{of}{Full}{Scale}} \right\rbrack} = \frac{\begin{matrix}\left( {{{Sensor}{Output}{at}{}50\%{Going}{Up}} -} \right. \\{\left. {{Sensor}{Output}{at}{}50\%{Going}{Down}} \right)*100}\end{matrix}}{{{Sensor}{Output}{at}100\%} - {{Sensor}{Output}{at}0\%}}$

The calibrated sensor parameter value(s) for the hysteresis parametermay be utilized to detect and/or assign uncertainty associated withcalibrated reading values produced by the sensor device. Thus, anoperator may identify when the sensor device does not measure within adesired accuracy range, and requires different subcomponents to improveaccuracy of the produced calibrated reading values (e.g., componentsless vulnerable to hysteresis effect). Additionally or alternatively,the calibrated sensor parameter value(s) for the hysteresis parametermay displayed to an operator, such as via a display associated with thesensor device and/or a calibration component. The calibrated sensorparameter value(s) for the hysteresis parameter enable the operatorand/or the sensor device, system, or a component thereof, to select dataacquisition components and/or sub-systems that minimize the hysteresiserror.

It should be appreciated that additional and/or alternative adjustablesensor parameters may be associated with a sensor device. For example,calibrated sensor parameter values may be determined and/or set for adead zone parameter, such that the calibrated sensor parameter value(s)may be used to remove dead zones associated with the sensor device, forexample by utilizing a calibrated lookup table. It should be appreciatedthat the above adjustable sensor parameters, calibrated sensor parametervalue(s), algorithms/formulas, and the like, are non-limiting examplesand not to limit the scope and spirit of the disclosure herein.

In other embodiments, the adjustment determination component 116includes hardware, circuitry, and/or the like, for receiving,determining, or otherwise identifying one or more calibrated sensorparameter values for one or more adjustable sensor parameters associatedwith the sensor device 102. For example, the adjustment determinationcomponent 116 may include one or more digital and/or analog inputs forreceiving a calibrated sensor parameter value set by a human operator(for example, via a display associated with the sensor adjustmentcomponent 114, calibration component 108, and/or sensor device 102). Insome embodiments, the adjustment determination component 116 receives adigital signal that represents one or more calibrated sensor parametervalues, for example in response to engagement with one or more physicalcomponents of the adjustment determination component 116.

The adjustment component 116 may, for example, communicate with theprocessor 12, I/O module 18, and/or memory 14 for receiving the digitalsignal that represents one or more calibrated sensor parameter values.The adjustment component may, additionally or alternatively, utilize theprocessor 12, memory 14, multi-point shunt calibration system 22, and/orthe like, to interpret the received digital signal and determine thecalibrated sensor parameter values for one or more adjustable sensorparameter.

The sensor adjustment component 114 includes adjustment settingcomponent 118. Sensor adjustment component 114 includes hardware,circuitry, and/or the like for setting and/or maintaining one or moreadjustable sensor parameters for the sensor device 102. In someembodiments, the adjustable setting component includes a non-volatilememory device for storing calibrated values for the one or moreadjustable sensor parameters for the sensor device 102. For example, thenon-volatile memory device may store a value for zero adjustment, gainadjustment, balance adjustment, or the like. In some embodiments, thenon-volatile memory is a component of the sensor device 102.

The adjustment setting component 118 may be configured to set one ormore calibrated sensor parameter values for each of the adjustablesensor parameters while the sensor device 102 is in calibration mode.The calibration values for each adjustable sensor parameter may bedetermined by and/or received from adjustment determination component116. In some embodiments, the adjustment setting component 118 writesthe calibration values for one or more adjustable sensor parameters,determined by and/or received from the adjustment determinationcomponent 116, to the non-volatile memory. The sensor device 102 mayaccess the non-volatile memory in a measuring mode and retrieve thecurrently stored calibration values for the one or more adjustablesensor parameters. Utilizing the calibration values, the sensor device102 may adjust the reading value output for a sensed input.

Alternatively, in some embodiments, the adjustment setting component 118includes hardware, circuitry, and/or the like for adjusting one or morephysical components of the sensor device 102. The adjustment settingcomponent 118 may be connected to one or more components of the sensordevice 102, and include an adjustable component for setting one or morephysical properties associated with the connected components of thesensor device 102. For example, the adjustment setting component 118 mayinclude devices, components, or other means for adjusting a resistanceof a physical component of the sensor device 102 (e.g., adjusting aresistance of a resistor in measuring bridge component 104.

In some embodiments, the adjustment setting component 118 is embodiedby, or associated with, one or more components of the circuitry 10. Forexample in some embodiments, the processor 12 and/or multi-point shuntcalibration system 22 are utilized to store the calibrated sensorparameter value(s) in a database, such as memory 14 and/or multi-pointshunt calibration database 24. The calibrated sensor parameter valuesmay be retrieved from the database, such as memory 14 and/or multi-pointshunt calibration database 24, in both measuring mode and calibrationmode to affect reading values output by the sensor device.

It should be appreciated that, in other embodiments, an alternativearrangement and/or combination of the components 102-118 may beutilized. For example, in some embodiments, the components may performoperations additional or alternative to those described above. In someembodiments, the components may be combined, such that a singlecomponent performs the operations of two or more of the components102-118 as described above, or operations of three of the components,four of the components, and the like. For example, the calibrationcomponent 108 may be combined with the shunt calibration component 106,such that the operations of the calibration component 108 may beperformed by the shunt calibration component 106, the sensor device 102,and/or a combination thereof. For example, the sensor adjustmentcomponent 114 may be combined with the shunt calibration component 106,sensor device 102, and/or calibration component 108, such that theoperations performed by sensor adjustment component 114 may be performedby the shunt calibration component 106, calibration component 108, or acombination thereof. Indeed, in some embodiments, a sensor device mayinclude all subcomponents, such that the sensor device includes hardwareand software for performing all operations described herein.Additionally or alternatively to the description above, in someembodiments, one or more of the sensor device 102, calibration component108, sensor adjustment component 114, or a combination thereof, mayutilize one or more of the components of circuitry 10. Accordingly, itshould be appreciated that the particular apparatus depicted in FIG. 2is a non-limiting example, and not to limit the scope and/or spirit ofthe disclosure herein.

Example Multi-Point Shunt Calibration Apparatuses

FIG. 3 illustrates a block diagram showing data flow between componentsof an example multi-point shunt calibration system 200 in accordancewith example embodiments of the present disclosure. The componentsillustrated in FIG. 3 may embody a sensor device and/or a calibrationcomponent integrated or otherwise associated with the sensor device. Forexample, the components illustrated in FIG. 3 may embody one or morecomponents of the apparatus 100, such as the calibration component 108,shunt calibration component 106, and/or a combination thereof. In someembodiments, the multi-point shunt calibration system 200 includes, isembodied by, or is otherwise associated with circuitry 10, and/orcomponents thereof. For example, in some embodiments, the multi-pointshunt calibration system 200 is configured to communicate with one ormore of the components of circuitry 10, such as processor 12, memory 14,multi-point shunt calibration system 22, and/or a combination thereof.

Components illustrated in dashed lines are capable of performing similarfunctions, as described below, such that only one of the components maybe necessary. In some embodiments, one of the components illustrated indashed lines may be removed. In other embodiments, both components maybe included such that only one component controls at any given time.

The apparatus 200 may include calibration switch 202A for activatingand/or deactivating calibration mode, and/or adjusting the simulatedcalibration output while in calibration mode (for example, according toa predefined output sequence). The calibration switch 202A outputs aswitch status signal 204A. In some embodiments, the switch status signal204A represents a calibration initialization signal when the calibrationswitch 202A is activated/engaged (e.g., indicating that calibration modeshould be activated). In some embodiments, the calibrationinitialization signal initializes the multi-point shunt calibrationmicrocontroller 206 to begin outputting based on a predefined outputsequence associated with an automatic output time shift interval. Thecalibration switch 202A may output a switch status signal 204A thatrepresents a calibration deinitialization signal when the calibrationswitch 202A is deactivated/disengaged (e.g., indicating that calibrationmode should be deactivated and/or measuring mode should be activated).The calibration deinitialization signal may causes the multi-point shuntcalibration microcontroller to stop outputting simulated calibrationoutputs based on the predefined output sequence.

In other embodiments, the switch status signal 204A represents an outputadjustment signal when the switch is activated/engaged in calibrationmode. The output adjustment signal may cause the multi-point shuntcalibration microcontroller 206 to adjust the interpretable calibrationvalue 208 being outputted. For example, engagement with the calibrationswitch 202A may output an output adjustment signal to cause themulti-point shunt calibration microcontroller 206 to produce theinterpretable calibration value 208 at a next value associated withvarious simulated calibration outputs in a predefined output sequence.In some embodiments, the calibration switch 202A may be utilized tocause outputting of the next simulated calibration output according to apredefined output sequence when the predefined output sequence and/ormulti-point shunt calibration microcontroller 206 are not associatedwith an automatic output shift time interval, such that a givensimulated calibration output is continuously outputted until the outputadjustment signal is received.

The calibration switch 202A may include multiple subcomponents foractivating calibration mode, deactivating calibration mode, and/oradjusting the presently outputted simulated calibration output. Forexample, the calibration switch may include a digital switch and/oranalog switch for each purpose, or a single digital or analog switch foractivating/deactivating calibration mode and another digital or analogswitch for adjusting the presently outputted simulated calibrationoutput.

In some embodiments, the calibration switch 202A is embodied by acalibration switch circuit. The calibration switch circuit is configuredto output a switch status signal indicating whether calibration modeshould be active. The switch status signal is output to the multi-pointshunt calibration microcontroller 206, and utilized by multi-point shuntcalibration microcontroller 206 as input. It should be appreciated thatthe calibration switch circuit may be embodied by various componentsand/or circuitry. For example, the calibration switch 202A may beembodied, in some embodiments, by the calibration switch circuit 400illustrated in FIG. 5 , as will be described further below.

The apparatus 200, alternatively or additionally, may includecalibration command control 202B. The calibration command control 202Bmay be configured for activating and/or deactivating calibration mode,and/or adjusting the simulated calibration output while in calibrationmode (for example, according to a predefined output sequence). Thecalibration command control 202B outputs a command control status signal204B. In some embodiments, the command control status signal 204Brepresents a calibration initialization signal when the calibrationcommand control 202B is activated/engaged (e.g., indicating thatcalibration mode should be activated). In some embodiments, thecalibration initialization signal initializes the multi-point shuntcalibration microcontroller 206 to begin outputting based on apredefined output sequence associated with an automatic output timeshift interval. The calibration command control 202B may output acommand control status signal 204B that represents a calibrationdeinitialization signal when the calibration command control 202B isdeactivated/disengaged (e.g., indicating that calibration mode should bedeactivated and/or measuring mode should be activated). The calibrationdeinitialization signal may cause the multi-point shunt calibrationmicrocontroller 206 to stop outputting simulated calibration outputsbased on the predefined output sequence.

In other embodiments, the command control status signal 204B representsan output adjustment signal when the calibration command control 202B isactivated/engaged in calibration mode. The output adjustment signal maycause the cause the multi-point shunt calibration microcontroller 206 toadjust the simulated calibration output being outputted. For example,engagement with the calibration command control 202B may produce anoutput adjustment signal to cause the multi-point shunt calibrationmicrocontroller 206 to produce the simulated calibration output that isadjacent to the presently outputted simulated calibration output in apredefined output sequence. In some embodiments, the calibration commandcontrol 202B may be utilized to cause outputting of the next simulatedcalibration output according to a predefined output sequence when thepredefined output sequence and/or multi-point shunt calibrationmicrocontroller 206 are not associated with an automatic output shifttime interval, such that a given simulated calibration output iscontinuously outputted until the output adjustment signal is received.

The calibration command control 202B may embody a software and/orhardware version of the calibration switch 202A. The calibration commandcontrol 202B may be embodied entirely by software, such as softwareexecuted on a processor, for example via the circuitry 10. In someembodiments, the calibration command control 202B includes softwareand/or hardware for facilitating communication between a sensor deviceand a calibration component/system via digital means. The calibrationcommand control 202B may include a digital communications interface forconnecting the sensor and a personal computing device, processor, orother system configured for initializing and/or managing multi-pointshunt calibration via the multi-point shunt calibration microcontroller206. For example, the calibration command control 202B may include a USB2.0, USB 3.0, Ethernet, or other digital communications interface forreceiving a command signal from another device (e.g., a connected PC,laptop, processor, or system). The calibration command control 202B mayinclude one or more inputs for activating calibration mode (such as bytransmitting a calibration initialization signal), adjusting thepresently outputted simulated calibration output (such as bytransmitting an output adjustment signal), and/or deactivatingcalibration mode (such as by transmitting a calibration deinitializationsignal).

The apparatus 200 includes multi-point shunt calibration microcontroller206. The multi-point shunt calibration microcontroller 206 takes, asinput, for example, switch status signal 204A or command control statussignal 204B. The multi-point shunt calibration microcontroller 206 mayinclude, or be associated with, a memory storing computer codedinstructions, which cause the multi-point shunt calibration controllerto perform the one or more operations described herein. For example, themulti-point shunt calibration microcontroller 206 may be embodied bycircuitry 10, one or more components thereof, and/or communicable withthe circuitry 10. The memory 14 and/or multi-point shunt calibrationdatabase 24 may be accessed to retrieve stored computer-codedinstructions for performing the operations described herein with respectto the multi-point shunt calibration microcontroller 206. Themicrocontroller 206, for example using the processor 12 and/ormulti-point shunt calibration system 22, may execute the instructionsbased on the inputs 204A or 204B.

In the embodiment illustrated in FIG. 3 , the multi-point shuntcalibration microcontroller 206 is configured to output an interpretablecalibration value 208 while calibration mode is active. For example, themulti-point shunt calibration microcontroller 206 may determinecalibration mode is active, or activate calibration mode, based on theswitch status signal 204A (e.g., when the switch status signal 204Arepresents a calibration initialization signal) or command controlstatus signal 204B. One of the signals may drive the multi-point shuntcalibration microcontroller 206 to determine and output an interpretablecalibration value.

In some embodiments, the multi-point shunt calibration microcontroller206 embodies, via hardware and/or software, a multi-point shuntcalibration state machine associated with a particular predefined outputsequence, where each state in the multi-point shunt calibration statemachine represents a particular interpretable calibration value 208corresponding to a particular simulated calibration output in thepredefined output sequence. For example, the multi-point shuntcalibration state machine may represent the predefined output sequenceprovided in Table 1 (below). The multi-point shunt calibrationmicrocontroller 206 may activate calibration mode and/or initialize themulti-point shunt calibration state machine at an initial calibrationoutput when the input switch status signal 204A or command controlstatus signal 204B represents a calibration initialization signal. Themulti-point shunt calibration microcontroller may continue outputtinginterpretable calibration value 208 based on the predefined outputsequence until a calibration deinitialization signal is received (forexample, via switch status signal 204A or command control status signal204B).

In some embodiments, the multi-point shunt calibration microcontroller206 is associated with an automatic output time shift interval. Forexample, the multi-point shunt calibration microcontroller 206 maycontinue outputting a particular interpretable calibration value 208(associated with a corresponding simulated calibration output) for theautomatic output time shift interval. The multi-point shunt calibrationmicrocontroller may operate a timer to track an output time associatedwith the currently outputted interpretable calibration value 208, andalter output of the interpretable calibration value 208 to be a nextinterpretable calibration value based on the predefined output sequenceafter the output time exceeds the automatic output time shift interval.For example, the currently produced interpretable calibration value 208may be associated with a first simulated calibration output, and may beadjusted to correspond to a second simulated calibration output that isadjacent to the first simulated calibration output in the defined outputsequence. In some embodiments, the multi-point shunt calibrationmicrocontroller 206 outputs various interpretable calibration values 208using time division multiplexing. In some embodiments, eachinterpretable calibration value 208 in a predefined output sequence isoutputted by the multi-point shunt calibration microcontroller 206utilizing time division multiplexing associated with an automatic outputtime shift interval. For example, the multi-point shunt calibrationmicrocontroller 206 may embody an automated multi-point shuntcalibration state machine such that each state in the automatedmulti-point shunt calibration state machine represents an interpretablecalibration value 208 associated with a predefined output sequence. Theautomated multi-point shunt calibration state machine may change statesbased on an automatic output time shift interval for each state, suchthat the interpretable calibration value 208 changes over time. In someembodiments, the multi-point shunt calibration microcontroller 206continues outputting the interpretable calibration value 208 based onthe predefined output sequence until a calibration deinitializationsignal is received, and may repeat the predefined output sequence (or aportion thereof) one or more times.

In other embodiments, the switch status signal 204A or command controlstatus signal 204B controls the interpretable calibration value 208outputted by the multi-point shunt calibration microcontroller 206. Forexample, in some embodiments, the multi-point shunt calibrationmicrocontroller 206 is associated with a predefined output sequence, andcontinues to output a particular interpretable calibration value 208until switch status signal 204A or command control status signal 204Brepresents an output adjustment signal. Upon receiving the outputadjustment signal, the multi-point shunt calibration microcontroller mayproduce the next interpretable calibration value 208 based on thepredefined output sequence (for example, by adjusting up or down torepresent a value that corresponds to an adjacent simulated calibrationoutput). In some embodiments, an operator may control the multi-pointshunt calibration microcontroller 206 (and, thus, the length of time aparticular interpretable calibration value 208 is outputted for)utilizing the calibration switch 202A or calibration command control202B.

Additionally or alternatively, in some embodiments, one or more of thecalibration switch 202A, calibration command control 202B, and/ormulti-point shunt calibration microcontroller 206 may be combined. Forexample, in some embodiments, the multi-point shunt calibrationmicrocontroller 206 includes hardware, circuitry, software, and/or acombination thereof to operate as the calibration switch 202A orcalibration command control 202B.

The interpretable calibration value 208 output from multi-point shuntcalibration microcontroller 206 is input into digital-to-analogconverter 210. The digital-to-analog converter 210 is configured toconvert the interpretable calibration value 208 into a correspondingconverted calibration signal 212. For example, the digital-to-analogconverter 210 may be configured to output a converted calibration signal212 that corresponds to a specific voltage based on the interpretablecalibration value 208.

Converted calibration signal 212 is output by digital-to-analogconverter 210 as input to output driver 214. The output driver 214 mayoutput a simulated calibration output 216 based on the convertedcalibration signal 212. In some embodiments, the output driver 214 maybe a voltage output driver. In other embodiments, the output driver 214may be a current output driver. The simulated calibration output 216 maybe output to the sensor device, for example to a measuring bridgecircuit of the sensor device, to cause the sensor device to produce areading value based on the simulated calibration output 216. Theparticular value of simulated calibration output 216 may be determinedat any given time, for example based on the command control statussignal 204B, interpretable calibration value 208, and/or convertedcalibration signal 212. Thus, when outputted to a sensor device, thesimulated calibration output 216 drives the sensor device to produce anactual reading value that may be compared with an expected reading valueto calibrate the sensor device.

In a particular example, the multi-point shunt calibrationmicrocontroller 206 is configured to generate specific interpretablecalibration values having values that drive the digital-to-analogconverter 210 to produce known calibrated calibration signals.Similarly, each converted calibration signal may be associated with aknown simulated calibration output. Further, each simulated calibrationoutput may be associated with an expected reading value (for example, acertain percentage of full scale). Similarly, each of the signals/valuesmay be associated with a predefined output sequence, and/orautomatically follow a predefined output sequence based on time-divisionmultiplexing.

The multi-point shunt calibration apparatus 200 may adjust the value ofsimulated calibration output 216 based on a defined sequence controlledby multi-point shunt calibration microcontroller 206. For example, themulti-point shunt calibration apparatus 200 may be associated with anautomatic output shift time interval, and/or an output step size betweenadjacent simulated calibration outputs. For example, the multi-pointshunt calibration apparatus 200 may continuously produce varioussimulated calibration outputs based on a predefined output sequence,such as simulated calibration outputs including an upper boundarysimulated calibration output, at least one intermediate simulatedcalibration output, and a lower boundary simulated calibration output,for example starting from the upper or lower boundary simulatedcalibration output and cycling one, two, three, or more times.

The following Table 1 is an example of corresponding interpretablecalibration values, converted calibration signals, simulated calibrationoutputs, and expected reading values for an example predefined outputsequence. Specifically, the predefined output sequence exemplified inTable 1 includes a full cycle with a step size of 25% of full scale fora given sensor. It should be appreciated that the specific values inTable 1 are non-limiting examples only.

For instance, the expected reading values may be 1%, 5%, 10%, 15%, 20%,25%, 30%, 35%, 40%, 45%, 50%, 55%, 60%, 65%, 70%, 75%, 80%, 85%, 90%,95%, 99%, 100%, or more values, or any combination thereof. A predefinedoutput sequence may include, in some embodiments, 1, 2, 3, 4, 5, 6, 7,or more steps including any portion of the full scale of a sensor invarious increments. For instance, the predefined output sequence may runfrom 15% to 75% of full scale in various increments (e.g., 5% step size,10% step size, or the like), 10% to 80% of full scale in variousincrements (e.g., 5% step size, 10% step size, or the like), or otherranges.

TABLE 1 Example Signal Values for Interpretable Calibration Value,Simulated Calibration Output, and Expected Reading Value InterpretableConverted Simulated Expected calibration Calibration Calibration Readingvalue Signal Output Value 0 0 volts −10 volts   0% Full Scale 163840.625 volts −5 volts  25% Full Scale 32768 1.25 volts 0 volts  50% FullScale 49152 1.875 volts 5 volts  75% Full Scale 65535 2.5 volts 10 volts100% Full Scale 49152 1.875 volts 5 volts  75% Full Scale 32768 1.25volts 0 volts  50% Full Scale 16384 0.625 volts −5 volts  25% Full Scale0 0 volts −10 volts   0% Full Scale

The predefined output sequence defines a specific predefined outputsequence, which begins at an initial calibration output equal to a lowerboundary simulated calibration output representing 0% of Full Scale, andfirst increases the value of each simulated calibration output accordingto a percentage step size of 25% of Full Scale until reaching an upperboundary simulated calibration output representing 100% of full scale.The predefined output sequence then decreases the value of eachsimulated calibration output, also by a percentage step size of 25% ofFull Scale, until reaching the lower boundary simulated calibrationoutput representing 0% again. The predefined output sequence may repeatin this cycle, for example after returning to the initial simulatedcalibration output, for one or more times.

It should be appreciated that the actual reading value produced by thesensor when increasing the value of the simulated calibration output inthe predefined output sequence may not equal the actual reading valueproduced by the sensor when decreasing the value of the simulatedcalibration output. In some embodiments, the differences in actualreading values produced by the sensor device when increasing/decreasingis used to detect one or more sensor errors, and/or determine and set acalibrated sensor parameter values for one or more adjustable sensorparameters associated with the sensor error(s). For example, hysteresiserrors may be detected based on such differences between actual readingvalues produced by the sensor device at the same simulated calibrationoutput when increasing/decreasing (for example, differences betweenreading values produced when outputting 75% of Full Scale after 50% ofFull Scale on the way up to the upper limit calibration output, and whenoutputting 75% of Full Scale after 100% of Full Scale on the way down tothe lower limit calibration output). The predefined output sequenceshould be followed such that the simulated calibration output does notjump between or otherwise skip values. For example, if any transientstate caused outputting of a simulated calibration output out of order,detection of one or more errors may be affected. For example, inaccordance with the predefined output sequence illustrated in FIG. 1 ,if the simulated calibration output was outputted at 0% of Full Scalefor a short duration while transitioning down from 75% of Full Scale to50% of Full Scale a simulated calibration value associated with 50% ofFull Scale may be incorrect and require re-calibration. The predefinedoutput sequence may be outputted many times (e.g., repeated 1 or moretimes) to minimize the effects of possible transient states.

FIG. 4 illustrates a block diagram showing data flow between componentsof an example multi-point shunt calibration apparatus 300 in accordancewith example embodiments of the present disclosure. The componentsillustrated in FIG. 4 may embody a calibration component integrated in asensor device, or otherwise associated with a sensor device. Forexample, the components illustrated in FIG. 4 may embody one or morecomponents of the apparatus 100, such as the calibration component 108,shunt calibration component 106, and/or a combination thereof. In someembodiments, the multi-point shunt calibration system 200 includes, isembodied by, or is otherwise associated with circuitry 10, and/orcomponents thereof. For example, in some embodiments, the multi-pointshunt calibration system 200 is configured to communicate with one ormore of the components of circuitry 10, such as processor 12, memory 14,multi-point shunt calibration system 22, and/or a combination thereof.

Components illustrated in dashed lines are capable of performing similarfunctions, as described below, such that only one of the components maybe necessary. In some embodiments, one of the components illustrated indashed lines may be removed. In other embodiments, both components maybe included such that only one component controls at any given time.

The apparatus 300 may include calibration switch 202A for activatingand/or deactivating calibration mode, and/or adjusting the simulatedcalibration output while in calibration mode (for example, according toa predefined output sequence). The calibration switch 202A outputs aswitch status signal 204A. In some embodiments, the switch status signal204A represents a calibration initialization signal when the calibrationswitch 202A is activated/engaged (e.g., indicating that calibration modeshould be activated). In some embodiments, the calibrationinitialization signal initializes the multi-point shunt calibrationmicrocontroller 306 to begin outputting based on a predefined outputsequence associated with an automatic output time shift interval. Thecalibration switch 202A may output a switch status signal 204A thatrepresents a calibration deinitialization signal when the calibrationswitch 202A is deactivated/disengaged (e.g., indicating that calibrationmode should be deactivated and/or measuring mode should be activated).The calibration deinitialization signal may causes the multi-point shuntcalibration microcontroller to stop outputting simulated calibrationoutputs based on the predefined output sequence.

In other embodiments, the switch status signal 204A represents an outputadjustment signal when the switch is activated/engaged in calibrationmode. The output adjustment signal may cause the multi-point shuntcalibration microcontroller 306 to adjust the pulse width modulatedcalibration value 308 being outputted. For example, engagement with thecalibration switch 202A may output an output adjustment signal to causethe multi-point shunt calibration microcontroller 306 to produce thepulse width modulated calibration value 308 corresponding to the nextsimulated calibration output in a predefined output sequence. In someembodiments, the calibration switch 202A may be utilized to causeoutputting of the next simulated calibration output according to apredefined output sequence when the predefined output sequence and/ormulti-point shunt calibration microcontroller 306 are not associatedwith an automatic output shift time interval, such that a givensimulated calibration output is continuously outputted by the apparatus300 until the output adjustment signal is received.

The calibration switch 202A may include multiple subcomponents foractivating calibration mode, deactivating calibration mode, and/oradjusting the presently outputted simulated calibration output. Forexample, the calibration switch may include a digital switch and/oranalog switch for each purpose, or a single digital or analog switch foractivating/deactivating calibration mode and another digital or analogswitch for adjusting the presently outputted simulated calibrationoutput.

In some embodiments, the calibration switch 202A is embodied by acalibration switch circuit. The calibration switch circuit is configuredto output a switch status signal indicating whether calibration modeshould be active. The switch status signal is output to the multi-pointshunt calibration microcontroller 306, and utilized by multi-point shuntcalibration microcontroller 306 as input. It should be appreciated thatthe calibration switch circuit may be embodied by various componentsand/or circuitry. For example, the calibration switch 202A may beembodied, in some embodiments, by the calibration switch circuit 400illustrated in FIG. 5 , as will be described further below.

The apparatus 300, alternatively or additionally, may includecalibration command control 202B. The calibration command control 202Bmay be configured for activating and/or deactivating calibration mode,and/or adjusting the simulated calibration output while in calibrationmode (for example, according to a predefined output sequence). Thecalibration command control 202B outputs a command control status signal204B. In some embodiments, the command control status signal 204Brepresents a calibration initialization signal when the calibrationcommand control 202B is activated/engaged (e.g., indicating thatcalibration mode should be activated). In some embodiments, thecalibration initialization signal initializes the multi-point shuntcalibration microcontroller 306 to begin outputting based on apredefined output sequence associated with an automatic output timeshift interval. The calibration command control 202B may output acommand control status signal 204B that represents a calibrationdeinitialization signal when the calibration command control 202B isdeactivated/disengaged (e.g., indicating that calibration mode should bedeactivated and/or measuring mode should be activated). The calibrationdeinitialization signal may cause the multi-point shunt calibrationmicrocontroller 306 to stop outputting simulated calibration outputsbased on the predefined output sequence.

In other embodiments, the command control status signal 204B representsan output adjustment signal when the calibration command control 202B isactivated/engaged in calibration mode. The output adjustment signal maycause the cause the multi-point shunt calibration microcontroller 306 toadjust the simulated calibration output being outputted. For example,engagement with the calibration command control 202B may produce anoutput adjustment signal to cause the multi-point shunt calibrationmicrocontroller 306 to produce the simulated calibration output at anext value in a predefined output sequence. In some embodiments, thecalibration command control 202B may be utilized to cause outputting ofthe next simulated calibration output according to a predefined outputsequence when the predefined output sequence and/or multi-point shuntcalibration microcontroller 306 are not associated with an automaticoutput shift time interval, such that a given simulated calibrationoutput is continuously outputted until the output adjustment signal isreceived.

The calibration command control 202B may embody a software and/orhardware version of the calibration switch 202A. For example, thecalibration command control 202B may be embodied entirely of softwareexecuted by a processing circuitry, such as via circuitry 10 or acomponent thereof. In some embodiments, the calibration command control202B includes software and/or hardware for facilitating communicationbetween a sensor device and a calibration component/system via digitalmeans. The calibration command control 202B may include a digitalcommunications interface for connecting the sensor and a personalcomputing device, processor, or other system configured for initializingand/or managing multi-point shunt calibration via the multi-point shuntcalibration microcontroller 306. For example, the calibration commandcontrol 202B may include a USB 2.0, USB 3.0, Ethernet, or other digitalcommunications interface for receiving a command signal from anotherdevice (e.g., a connected PC, laptop, processor, or system).

The apparatus 300 includes multi-point shunt calibration microcontroller306. The multi-point shunt calibration microcontroller 306 takes, asinput, for example, switch status signal 204A or command control statussignal 204B. The multi-point shunt calibration microcontroller 306 mayinclude, or be associated with, a memory storing computer codedinstructions, which cause the multi-point shunt calibration controllerto perform the one or more operations described herein. For example, themulti-point shunt calibration microcontroller 306 may be embodied bycircuitry 10, one or more components thereof, and/or communicable withthe circuitry 10. The memory 14 and/or multi-point shunt calibrationdatabase 24 may be accessed to retrieve stored computer-codedinstructions for performing the operations described herein with respectto the multi-point shunt calibration microcontroller 306. Themicrocontroller 306, for example using the processor 12 and/ormulti-point shunt calibration system 22, may execute the instructionsbased on the inputs 204A or 204B.

In the embodiment illustrated in FIG. 4 , the multi-point shuntcalibration microcontroller 306 is configured to output a pulse widthmodulated calibration value 308 while calibration mode is active. Forexample, the multi-point shunt calibration microcontroller 306 maydetermine calibration mode is active, or activate calibration mode,based on the switch status signal 204A (e.g., when the switch statussignal 204A represents a calibration initialization signal). The commandcontrol status signal 204B may drive the multi-point shunt calibrationmicrocontroller 306 to determine and output a pulse width modulatedcalibration value 308. The pulse width modulated calibration value 308may correspond to a known value of fixed-frequency pulse train withpulses of varying width, which corresponds to a particular simulatedcalibration output.

In some embodiments, the multi-point shunt calibration microcontroller306 embodies, via hardware and/or software, a multi-point shuntcalibration state machine associated with a particular predefined outputsequence, where each state in the multi-point shunt calibration statemachine represents a particular pulse width modulated calibration value308 corresponding to a particular simulated calibration output in thepredefined output sequence. For example, the multi-point shuntcalibration state machine may represent the predefined output sequenceprovided in Table 1 (below). The multi-point shunt calibrationmicrocontroller 306 may activate calibration mode and/or initialize themulti-point shunt calibration state machine at an initial calibrationoutput when the input switch status signal 204A or command controlstatus signal 204B represents a calibration initialization signal. Themulti-point shunt calibration microcontroller may continue outputtingpulse width modulated calibration value 308 until a calibrationdeinitialization signal is received (for example, via switch statussignal 204A or command control status signal 204B).

In some embodiments, the multi-point shunt calibration microcontroller306 is associated with an automatic output time shift interval. Forexample, the multi-point shunt calibration microcontroller 306 maycontinue outputting a particular pulse width modulated calibration value308 (associated with a corresponding simulated calibration output) forthe period of time representing the automatic output time shiftinterval. The multi-point shunt calibration microcontroller may track anoutput time associated with the currently outputted pulse widthmodulated calibration value 308, and output a next pulse width modulatedcalibration value 308 based on the predefined output sequence after theoutput time exceeds the automatic output time shift interval. In someembodiments, the multi-point shunt calibration microcontroller 306outputs various pulse width modulated calibration values 308 using timedivision multiplexing. In some embodiments, each pulse width modulatedcalibration value 308 in a predefined output sequence is outputted bythe multi-point shunt calibration microcontroller 306 utilizing timedivision multiplexing associated with an automatic output time shiftinterval. For example, the multi-point shunt calibration microcontroller306 may embody an automated multi-point shunt calibration state machinesuch that each state in the automated multi-point shunt calibrationstate machine represents a pulse width modulated calibration value 308associated with a predefined output sequence. The automated multi-pointshunt calibration state machine may change states based on an automaticoutput time shift interval for each state, such that the pulse widthmodulated calibration value 308 changes over time. In some embodiments,the multi-point shunt calibration microcontroller 306 continuesoutputting the pulse width modulated calibration value 308 based on thepredefined output sequence until a calibration deinitialization signalis received, and may repeat the predefined output sequence (or a portionthereof) one or more times.

In other embodiments, the switch status signal 204A or command controlstatus signal 204B controls the pulse width modulated calibration value308 outputted by the multi-point shunt calibration microcontroller 306.For example, in some embodiments, the multi-point shunt calibrationmicrocontroller 306 is associated with a predefined output sequence, andcontinues to output a particular pulse width modulated calibration value308 until switch status signal 204A or command control status signal204B represents an output adjustment signal. Upon receiving the outputadjustment signal, the multi-point shunt calibration microcontroller mayproduce the next pulse width modulated calibration value 308 based onthe predefined output sequence. In some embodiments, an operator maycontrol the multi-point shunt calibration microcontroller 306 (and,thus, the length of time a particular pulse width modulated calibrationvalue 308 is outputted for) utilizing the calibration switch 202A orcalibration command control 202B.

The pulse width modulated calibration value 308 output from multi-pointshunt calibration microcontroller 306 is input into RC Filter 310. TheRC filter 310 is configured to filter the pulse width modulatedcalibration value 308 into a corresponding filtered calibration signal312. For example, the RC filter 310 may be configured to output afiltered calibration signal 312 that corresponds to a specific voltagebased on the duty cycle associated with the pulse width modulatedcalibration value 308. In other embodiments, alternative filtercomponents may similarly be utilized.

Filtered calibration signal 312 is output by RC filter 310 as input tooutput driver 314. The output driver 314 may output a simulatedcalibration output 316 based on the filtered calibration signal 312. Insome embodiments, the output driver 314 may be a voltage output driver.In other embodiments, the output driver 314 may be a current outputdriver. The simulated calibration output 316 may be output to the sensordevice, for example to a measuring bridge circuit of a sensor device, tocause the sensor device to produce a reading value based on thesimulated calibration output 316. The particular value of simulatedcalibration output 316 may be determinable at any given time, forexample based on the switch status signal 204A or command control statussignal 204B, pulse width modulated calibration value 308, and/orfiltered calibration signal 312. Thus, if output to a sensor device, thesimulated calibration output 316 drives the sensor device to produce anactual reading value that may be compared with an expected reading valueto calibrate the sensor device.

In a particular example, the multi-point shunt calibrationmicrocontroller 304 is configured to generate specific pulse widthmodulated calibration values 308 that drive the RC filter 310 to produceknown filtered calibration signals 312. The pulse width modulatedcalibration value 308 may have a fixed-frequency pulse train with pulsesof varying width to represent a particular value. Similarly, eachfiltered calibration signal 312 may be associated with a known simulatedcalibration output 316. Further, each simulated calibration output maybe associated with an expected reading value (for example, a certainpercentage of full scale). Similarly, each of the signals/values may beassociated with a predefined output sequence, and/or automatically cyclebased on time-division multiplexing.

The multi-point shunt calibration apparatus 300 may adjust the output ofsimulated calibration output based on a defined sequence. For example,the multi-point shunt calibration apparatus 300 may be associated withan automatic output shift time interval, and/or an output step sizebetween subsequent simulated calibration outputs. For example, themulti-point shunt calibration apparatus 300 may be configured to cyclebetween an upper boundary simulated calibration output, at least oneintermediate simulated calibration output, and a lower boundarysimulated calibration output, for example starting from the upper orlower boundary simulated calibration output and cycling one, two, three,or more times.

FIG. 5 illustrates a calibration switch circuit 400. The calibrationswitch circuit 400 is an example, non-limiting embodiment of acalibration switch, for example that may embody calibration switch 202Aand/or calibration switch 202A. Turning to FIG. 5 , the calibrationswitch circuit 400 includes voltage source 402. The voltage source 402may be switched, for example automatically or by an operator, to outputa voltage V1. V1 is a sufficient voltage to produce current across Zenerdiode 404. In other words, V1 satisfies a Zener threshold associatedwith the Zener diode 404.

When voltage V1 is output from voltage source 402, optocoupler 406 isactivated. Activation of optocoupler 406 causes output of a switchstatus signal as switch status signal 408. For example, switch statussignal 408 may represent a calibration initialization signal when thevoltage value of switch status signal 408 is increased based on voltageV1. When voltage V1 is not output, current cannot flow across the Zenerdiode 404, and thus optocoupler 406 is not activated. Accordingly, theswitch status signal may represent a calibration deinitialization signalwhen the Zener diode is switched off.

The voltage 410 provides a default switch status signal 408, forexample, based on the voltage 410 and the subsequent resistor 412.Accordingly, when the optocoupler 406 is activated, and the voltagedecrease caused by the output of the optocoupler 406 adjusts the switchstatus signal 408. For example, in an embodiment, the switch statussignal 408 is a “Logic High.” When the voltage source 402 is greaterthan or equal to 10 volts, the switch status signal 408 changes to“Logic Low.”

In some embodiments, the voltage source 402 may provide a voltage equalto or greater than 10 volts upon activation. The resistor 414 may beassociated with a resistance of 820 Ohms, and the resistor 412 may beassociated with a resistance of 4,700 Ohms. In some embodiments, thevoltage 410 may be 3.3 volts. In some embodiments, the Zener thresholdassociated with the Zener diode 404 may be 7.5 volts. When the voltagesource 402 is activated, current flows to activate optocoupler 406.Accordingly, the switch status signal 408 may be adjusted from a normaloutput, thus representing a calibration initialization signal. It shouldbe understood that the various components illustrated in FIG. 6 may havevarious values, impedances, and/or the like, without deviating from thescope of the disclosure herein.

FIG. 6 illustrates an example multi-point shunt calibration circuit 500in accordance with embodiments of the disclosure herein. The multi-pointshunt calibration circuit 500 includes corresponding arrays ofoptocouplers 506A-506C, output adjustment switches 510A-510C and fixedresistors 512A-512C, in conjunction with reference voltage 508 andopamps 514A and 514B. It should be appreciated that, in someembodiments, alternative components may be used to those illustrated inmulti-point shunt calibration circuit 500. The Voltage CC 508 mayprovide power to each of the components illustrated.

The multi-point shunt calibration circuit 500 receives inputs SC_PWR502, SC_1 504A, SC_2 504B, and SC_3 504C. The inputs SC_PWR 502, SC_1504A, SC_2 504B, and SC_3 504C may be associated with one or morecalibration input components, for example a digital input component, asingle multi-value calibration component, or a plurality of calibrationinput switches (not shown). In some embodiments, the calibration inputcomponents may be controlled by signals output from a calibration switchor a calibration command control. As illustrated, SC_PWR 502 providespositive voltage to the cathode side of the LEDs in the variousoptocouplers 506A-506C. SC_1 504A, SC_2 504B, and SC_3 504C includeinput pins and/or terminals accessible to the user. Each of theoptocouplers 506A-506C may be activated utilizing SC_PWR 502 and oneselected from the group of SC_1 504A, SC_2 504B, and SC_3 504C. Forexample, the optocoupler 506A may be activated by connecting SC_PWR 502to a positive voltage greater than or equal to a defined voltage level(for example, 5 volts, 12 volts, or 24 volts) and by connecting SC_1504A to 0 volts. Similarly, the optocoupler 506B may be activated byconnecting SC_PWR 502 to a positive voltage greater than or equal to adefined voltage level (for example, 5 volts, 12 volts, or 24 volts) andby connecting SC_2 504B to 0 volts. Additionally, as illustrated, theoptocoupler 506C may be similarly activated by connecting SC_PWR 502 toa positive voltage greater than or equal to a defined voltage level (forexample, 5 volts, 12 volts, or 24 volts) and by connecting SC_3 504C to0 volts.

The multi-point shunt calibration circuit 500 outputs simulatedcalibration output 516. The multi-point shunt calibration circuit 500may output the simulated calibration output 516 to a sensor device forfurther processing and/or to display a corresponding reading value. Thesimulated calibration output 516 may be added to the analog outputvoltage of the sensor device to output a corresponding actual readingvalue. For example, if no sensed value is applied to the sensor device(e.g., the sensor device is a pressure sensor with no pressure appliedto the sensor), the sensor may be driven 0 volts to output an actualreading value associated with 0 volts. A user may then initialize inputSC_1 504A to be “ON”/activated, and inputs SC_2 504B and SC_3 506C to be“OFF”/deactivated, causing the multi-point shunt calibration circuit 500to output a first simulated calibration output 516 corresponding to afirst percentage of full scale. For example, when SC_1 504A only isactivated, the multi-point shunt calibration circuit 500 may producesimulated calibration output 516 that corresponds to 25% of full scale(such as 1.25 volts on a 0-5 volt output sensor device). The variouscombinations of activating SC_1 504A, SC_2 504B, and SC_3 504C mayprovide different values of simulated calibration output 516, which getadded to the base sensor output to produce an actual reading value basedon the simulated calibration output. In an example embodiment, forexample, activation of SC_1 504A and SC_2 504B may produce simulatedcalibration output 516 at 50% of full scale for a sensor device,activation of SC_1 504A and SC_3 504C may produce simulated calibrationoutput 516 at 75% of full scale for the sensor device, and activation ofall SC_1 504A, SC_2 504B, and SC_3 504C may produce simulatedcalibration output 516 at 100% of full scale for the sensor device. Inother embodiments, similar results may be realized for a current outputsensor, for example a 4-20 mA current output sensor.

Each of the inputs 504A-504C is associated with an optocoupler506A-506C. The optocouplers 506A-506C are configured to transfer asignal based on the corresponding input signal 504A-504C. When thecorresponding input signal is active, a corresponding output adjustmentswitch 510A-510C is activated. The activation of the output adjustmentswitches 510A-510C cause a corresponding fixed resistor 512A-512C to beconnected in parallel and alter the voltage resulting from the fixedresistors switched to be included in the circuit based on referencevoltage 508. The voltage resulting from the fixed resistors switched tobe included in the circuit is then input into opamps 514A and 514B,which output the final simulated calibration output 516.

Each input is associated with one optocoupler, output adjustment switch,and fixed resistor. For example, the status of SC_1 504A determines thestatus of optocoupler 506B, which similarly determines the connection ofoutput adjustment switch 510A. As illustrated, output adjustment switch510A may be connected to reference voltage 508, or 0 volts. The settingof output adjustment switch 510A alters the voltage connected to thefixed resistor 512A. If SC_1 504A is “ON”/activated, optocoupler 506A isactivated, which connects the fixed resistor 512A to the referencevoltage 508 through output adjustment switch 510A. Alternatively, ifSC_1 504A is “OFF”/deactivated, optocoupler 506A is deactivated, whichconnects the fixed resistor 512A to 0 volts through output adjustmentswitch 510A. Similarly, the status of SC_2 504B determines the status ofoptocoupler 506B, which similarly determines the connection of outputadjustment switch 510B. Output adjustment switch 510B may be connectedto reference voltage 508, or 0 volts. The setting of output adjustmentswitch 510B alters the voltage connected to the fixed resistor 512B. IfSC_2 504B is “ON”/activated, optocoupler 506A is activated, whichconnects the fixed resistor 512B to the reference voltage 508 throughoutput adjustment switch 510B. Alternatively, if SC_2 504B is“OFF”/deactivated, optocoupler 506B is deactivated, which connects thefixed resistor 512B to 0 volts through output adjustment switch 510B.This configuration is continued for SC_3 504B, and indeed may beutilized with respect to more input signals (not shown). The value ofsimulated calibration output 516 depends on the value of the referencevoltage 508, which may be fixed, and the combinations of the variousswitch positions of adjustment output switches 510A-510C based on inputsSC_1 504A-504C. Accordingly, each combination of inputs SC_1 504A, SC_2504B, and SC_3 504C (and/or other input signals), corresponds to a knownsimulated calibration output 516. Thus, adjusting the various inputs504A-504C causes the multi-point shunt calibration circuit 500 toproduce various simulated calibration outputs to facilitate multi-pointshunt calibration.

Example Multi-Point Shunt Calibration Processes

FIGS. 7 and 8 illustrate example operations for multi-point shuntcalibration of a sensor device in accordance with example embodiments ofthe present disclosure. It should be appreciated that the illustratedoperations may be performed in various orders, and in some embodimentsmay include alternative or additional operations from those illustrated.The operations illustrated with respect to FIGS. 7 and 8 are illustratedby way of example, and the scope and spirit of the disclosure is notlimited to the specific operations and/or processes depicted. In someembodiments, some or all of the operations illustrated in FIGS. 7 and 8may be performed by one or more components associated calibrationcomponent configured for implementing the example processes, for examplewhere the calibration component is attached to, included in, orotherwise associated with a sensor device.

FIG. 7 illustrates a flowchart describing example operations in aprocess 600 for multi-point shunt calibration of a sensor device inaccordance with some example embodiments of the present disclosure. Insome embodiments, one or more of the operations are performed by amulti-point shunt calibration apparatus including a multi-point shuntcalibration microcontroller, the multi-point shunt calibrationmicrocontroller configured to execute the operations based on computercoded instructions. For example, in some embodiments, the operationsdescribed with respect to FIG. 7 are performed by circuitry 10,apparatus 200, and/or apparatus 300. In some embodiments, the apparatus200 performs one or more of the operations illustrated with respect toFIG. 7 utilizing one or more of the components of circuitry 10. In someembodiments, the apparatus 300 performs one or more of the operationsillustrated with respect to FIG. 7 utilizing one or more of thecomponents of circuitry 10.

The process 600 includes block 602 of receiving a calibrationinitialization signal associated with a sensor, the sensor associatedwith at least one adjustable sensor parameter. The calibrationinitialization signal indicates that the sensor is in calibration mode.The calibration initialization signal may be received in response toactivation and/or engagement of a calibration mode management component.

The process 600 includes block 604 of outputting a first simulatedcalibration output. The first simulated calibration output may beassociated with a first actual reading value (e.g., an actual readingvalue produced by a sensor device). The first simulated calibrationoutput may also be associated with a first expected reading value. Thefirst expected reading value may be stored in a non-transitory memory,such that the sensor device, an associated calibration component and/orsensor adjustment component, may retrieve the expected reading valuefrom the non-transitory memory.

The process 600 includes block 606 of outputting a second simulatedcalibration output. The second simulated calibration output may beassociated with a second actual reading value (e.g., an actual readingvalue produced by the sensor device). The second simulated calibrationoutput may also be associated with a second expected reading value (forexample, stored in a non-transitory memory).

The process 600 includes block 608 of outputting a third simulatedcalibration output. The third simulated calibration output may beassociated with a third actual reading value (e.g., an actual readingvalue produced by the sensor device). The third simulated calibrationoutput may also be associated with a third expected reading value (forexample, stored in a non-transitory memory). It should be appreciatedthat the expected reading values may be predetermined and/orpre-calculated, and associated with and/or provided with a sensordevice.

Each simulated calibration output may be output to a sensor device tocause the sensor device to output a reading value based on the simulatedcalibration output (e.g., an actual reading value). Each simulatedcalibration output may be known and/or determinable, such that for agiven sensor, an expected reading value for the sensor device may alsobe known. In a particular example where a simulated calibration outputis a voltage, for example, a first simulated calibration output of −10volts may be associated with an expected reading value of 0% of fullscale, a second simulated calibration output of 0 volts may beassociated with an expected reading value of 50% of full scale, and athird simulated calibration output of 10 volts may be associated with anexpected reading value of 100% of full scale.

In some embodiments, each simulated calibration output is adjusted to anew simulated calibration output based on an output step size. The firstsimulated calibration output may be one output step size greater than(or less than) the second simulated calibration output, and similarlythe second simulated calibration output may be one output step sizegreater than (or less than) the third simulated calibration output. Thesimulated calibration outputs may be associated with a determined outputsequence, for example the determined output sequence described withrespect to FIG. 9 below.

The simulated calibration output may be output based on one or moreinput signals. In some embodiments, each of the one or more inputsignals associated with outputting a corresponding simulated calibrationoutput is associated with a calibration value input component. Forexample, a calibration value input may be an analog signal for causing aparticular simulated calibration output to be outputted by an apparatus,such as the apparatus 200 or 300, or a multi-point shunt calibrationcircuit, such as the multi-point shunt calibration circuit 400. In someembodiments, the one or more input signals are determined based on inputfrom a digital input component. In other embodiments, the one or moreinput signals may be associated with a setting of a multi-value inputcomponent.

In some embodiments, the simulated calibration output is an output by amulti-point shunt calibration circuit. The multi-point shunt calibrationcircuit is configured to output a simulated calibration output based onthe one or more input signals by changing various physical elements ofthe multi-point shunt calibration circuit based on the one or more inputsignals. For example, each input signal may be associated with an outputadjustment switch and/or fixed resistor, such that the status of theinput signal determines whether the output adjustment switch includesthe fixed resistor in the multi-point shunt calibration circuit.

In other embodiments, the simulated calibration output is an output by amulti-point shunt apparatus including a multi-point shunt calibrationmicrocontroller. The multi-point shunt calibration microcontroller mayreceive a switch status signal or a command control status signal. Theswitch status signal or command control status signal may represent acalibration initialization signal when calibration mode is activated,for example when the component (or a subcomponent thereof) is activatedvia engagement by a user.

In some embodiments, the calibration switch (or calibration commandcontrol) is configured to output a switch status signal (or commandcontrol status signal) that represents an output adjustment signal tothe multi-point shunt calibration microcontroller to adjust the outputproduced by the multi-point shunt calibration microcontroller. Thecalibration switch or calibration command control may include a timerfor automatically outputting the output adjustment signal, for examplebased on one or more automatic output time shift intervals.

In some embodiments, the multi-point shunt calibration microcontrolleroutputs a representative calibration value that is set or adjusted basedon the switch status signal or command control status signal. Forexample, the multi-point shunt calibration microcontroller, uponreceiving a calibration initialization signal, may output an initialrepresentative calibration value corresponding to an initial simulatedcalibration output in a predefined output sequence. The multi-pointshunt calibration microcontroller may then output an adjacentrepresentative calibration value when an output adjustment signal isreceived. In some embodiments, the representative calibration value is apulse width modulated calibration value that is output from themulti-point shunt calibration microcontroller to a RC filter. The pulsewidth modulated calibration value may represent different values basedon the pulse width of the signal. For example, in some embodiments, apulse width modulated calibration value having a higher duty cycle isassociated with a higher command control status signal, and thusassociated with a higher simulated calibration output.

The RC filter outputs a corresponding filtered calibration signal basedon the pulse width modulated calibration value. The correspondingfiltered calibration signal is input into an output driver that outputsthe corresponding simulated calibration output, which drives the sensordevice to provide a corresponding reading value.

In other embodiments the representative calibration value is aninterpretable calibration value that is output from the multi-pointshunt calibration microcontroller to a digital-to-analog converter. Thedigital-to-analog converter outputs a corresponding convertedcalibration signal. The corresponding converted calibration signal isinput into an output driver that outputs the corresponding simulatedoutput based on the converted calibration signal. The simulatedcalibration output drives the sensor device to provide a correspondingreading value.

The process 600 includes optional block 610 of outputting at least oneadditional simulated calibration output, each additional simulatedcalibration output associated with an additional expected reading valueand an additional actual reading value. By outputting additionalsimulated calibration outputs, more actual reading values may bedetermined and utilized in calibrating one or more adjustable sensorcomponents.

The process 600 includes optional block 612 of determining a calibratedsensor parameter value for the calibrated sensor parameter based on atleast (1) the first actual reading value, (2) the second actual readingvalue, and (3) the third actual reading value. In some embodiments, thecalibrated sensor parameter value is also based on at least oneadditional actual reading value and at least one expected additionalreading value. In other embodiments, the calibration sensor parametervalue may, additionally or alternatively, be based on at least thefirst, second, and third expected reading values.

In some embodiments, the calibrated sensor parameter value is determinedautomatically. For example, in some embodiments, a sensor device and/orcalibration component is pre-programmed, or otherwise identifies one ormore formulas for determining the calibrated sensor parameter valuesbased on at least the first actual reading value, second actual readingvalue, and third actual reading. In other embodiments, the calibratedsensor parameter value is based on at least the first actual readingvalue and a first expected reading value, a second actual reading valueand a second expected reading value, and a third actual reading valueand a third expected reading value. For example, each pair of actualreading value and expected reading value associated with each simulatedcalibration output may be used to determine a calibration error valueassociated with the simulated calibration output. In some embodiments,for example a calibration error value represents a difference betweenthe expected reading value and the actual reading value associated witha particular simulated calibration output. The calibrated sensorparameter value may then be received from a calibrated valuedetermination formula based on the calibrated error values.

In other embodiments, the calibrated sensor parameter value is receivedin response to engagement with one or more sensor parameter adjustablecomponents. For example, an operator may engage with one or more sensorparameter adjustment buttons, sensor parameter adjustment knobs, orother components, which enable input of a calibrated sensor parametervalue.

The process 600 includes block 614 of setting the at least oneadjustable sensor parameter associated with the sensor to the calibratedsensor parameter value. The calibrated sensor parameter is based on atleast (1) the first actual reading value and the first expected readingvalue, (2) the second actual reading value and the second expectedreading value, and (3) the third actual reading value and the thirdexpected reading value.

In some embodiments, the calibrated sensor parameter value is stored ina non-transitory memory. The calibrated sensor parameter value may bestored associated with a corresponding adjustable sensor parameterand/or simulated calibration output (or corresponding percentage of fullscale, for example), such that it may be retrieved from thenon-transitory memory based on the adjustable sensor parameter. Thecalibrated sensor parameter value may be retrieved when the sensordevice returns to measuring mode. The calibrated sensor parameter valuemay then be utilized to adjust values measured by the sensor. In someembodiments, one or more components of the circuitry 10 are utilized tostore and/or retrieve the calibrated sensor parameter value. Forexample, the processor 12 and/or multi-point shunt calibration system 22may be utilized to store one or more calibrated sensor parameter valuefor various adjustable sensor parameters to the multi-point shuntcalibration database 24 and/or memory 14. Additionally or alternatively,the processor 12 and/or multi-point shunt calibration system 22 may beutilized to retrieve one or more calibrated sensor parameter values forvarious adjustable sensor parameters from the multi-point shuntcalibration database 24 and/or memory 14, for example to adjust areading value in measuring mode and/or calibration mode.

In some embodiments, a sensor device is associated with one or moreadjustable sensor parameters that includes a non-linearity parameter.One or more calibrated sensor parameter value(s) may be determinedand/or stored, or otherwise set, for the non-linearity parameter in anon-transitory memory, and retrieved for use in measuring mode. Forexample, non-linearity error may be corrected using a higher orderpolynomial, or by generating a calibrated lookup table defined between0% and 100% range of the sensor device based on various actual readingvalues, expected reading values, and/or the calibrated sensor parametervalues.

In some embodiments, an adjustable sensor parameter is utilized toinform decisions regarding the sensor device, or sub-components and/orsub-systems thereof. For example, a sensor device may be associated withone or more adjustable sensor parameters that includes a hysteresisparameter. One or more calibrated sensor parameter value(s) may bedetermined and/or stored, or otherwise set, for the hysteresisparameter. The calibrated sensor parameter value(s) for the hysteresisparameter may be retrieved and/or utilized by an operator and/or thesensor device to determine an overall uncertainty assigned to a readingvalue in measuring mode. Additionally or alternatively, the calibratedparameter value(s) for the hysteresis parameter may be utilized, forexample by an operator, sensor device, or external device associatedwith the sensor device, to select one or more data acquisitioncomponents and/or subsystems that improve performance of the sensordevice with regard to hysteresis. In some embodiments, one or morecalibrated parameter value(s) for an adjustable sensor parameter may beoutput via a display associated with the sensor device, for example suchthat an operator may view the calibrated sensor value(s) for theadjustable sensor parameter and utilize the calibrated parametervalue(s) for the adjustable sensor parameter to in making decisionsassociated with the sensor device.

The various adjustable sensor parameters may be utilized in a myriad ofways to calibrate the sensor device. Additionally or alternatively, thevarious adjustable sensor parameters may be utilized in a myriad of waysto inform the operator and/or a system of the sensor device regardingthe accuracy of reading values produced by the sensor device.Accordingly, it should be appreciated that the particular embodimentsand specific adjustable sensor parameters discussed above arenon-limiting examples, and not to narrow the scope or spirit of thedisclosure herein.

FIG. 8 illustrates a flowchart describing example operations formulti-point shunt calibration of a sensor device, specifically forholding the output of a simulated calibration output, in accordance withsome example embodiments of the present disclosure. In some embodiments,a simulated calibration output is performed for an automatic outputautomatic output time shift interval, then cycled such that a newsimulated calibration output is performed (e.g., outputted) based on apredefined output sequence. However, an operator may desire to continueoutputting the presently outputted simulated calibration output, forexample to continue outputting the presently outputted simulatedcalibration output while the operator adjusts one or more sensoradjustment components during calibration. In this regard, the operationsof example process 700 illustrated in FIG. 8 enable holding the outputof a simulated calibration output, for example by engaging a hold inputassociated with a calibration component and/or sensor device.

In some embodiments, the process 700 is utilized to hold output of asimulated calibration output in one of the blocks of process 600illustrated in FIG. 7 . For example, in some embodiments, output of thefirst simulated calibration output, output of the second simulatedcalibration output, or output of the third simulated calibration outputis held in accordance with the process 700. It should be appreciatedthat, in some embodiments, the process 700 may be repeated for output ofvarious simulated calibration outputs during one or more predefinedoutput sequences.

The process 700 includes block 702 of receiving a hold initializationsignal. In some embodiments, the hold initialization signal is receivedfrom a hold input component. For example, an operator may engage a holdinput component associated with a calibration component and/or sensordevice. In some embodiments, the hold input component is a hold inputswitch (such as an analog or digital switch). The hold initializationsignal may be received in response to activation of the hold inputswitch (e.g., a high-low signal or a digital signal).

The process 700 includes block 704 of outputting a presently outputtedsimulated calibration output until a hold cancellation signal isreceived. In some embodiments, a calibration command control determinesa current command control status signal, and continues to output thecurrent command control status signal to cause continued outputting ofthe corresponding presently outputted simulated calibration output untilthe hold cancellation signal is received. For example, the holdinitialization signal may be input into the calibration command controlas a control signal.

In other embodiments, the hold initialization signal is input into amulti-point shunt calibration microcontroller as a control input. Themulti-point shunt calibration microcontroller may continue to output acurrent representative calibration value corresponding to the presentlyoutputted simulated calibration output until a hold cancellation signalis received.

The process 700 includes block 706 of receiving the hold cancellationsignal. The hold cancellation signal is received from the hold inputcomponent. For example, an operator may disengage/deactivate the holdinput component to cause the hold cancellation signal to be received. Insome embodiments, the hold input component is a hold input switch (suchas an analog or digital switch). The hold cancellation signal may bereceived in response to deactivation of the hold input switch.

The process 700 includes block 708 of outputting a next simulatedcalibration output. In some embodiments, the next simulated calibrationoutput is determined based on a predefined output sequence. Thepredefined output sequence may then continue automatically based on anautomatic output time shift interval.

Example Visualization of Automatically Output Simulated CalibrationOutputs in a Predefined Output Sequence

FIG. 9 illustrates a visualization of an example simulated calibrationoutputs in an example predefined output sequence, in accordance withsome example embodiments of the present invention. The visualization 800may be embodied by a multi-point shunt calibration apparatus including amulti-point shunt microcontroller configured for outputting varioussimulated output components based on an automatic output time shiftinterval and output step size. For example, the visualization 800 may beembodied by software for configuring the circuitry 10, the multi-pointshunt calibration apparatus 200 and/or multi-point shunt calibrationapparatus 300, as described above. For example, a configured multi-pointshunt calibration microcontroller may be configured to automaticallyproduce representative calibration values based on the predefined outputsequence, output step size, and automatic output time shift interval,for example with the values as illustrated. As an example, thevisualization 800 is described with respect to an example multi-pointshunt calibration apparatus.

The multi-point shunt calibration apparatus configured embodying thevisualization 800 is associated with an automatic output time shiftinterval of 1 second. The example multi-point shunt calibrationapparatus thus outputs a simulated calibration output for 1 secondbefore adjusting to output a new simulated calibration output that isadjacent based on the predefined output sequence. The examplemulti-point shunt calibration apparatus is also associated with apredefined output sequence. Specifically, the predefined output sequenceincludes adjustments to the simulated calibration output of an outputstep size of 25% of full scale for each step.

At time 0, for example, the example multi-point shunt calibrationapparatus outputs an initial simulated calibration output thatrepresents 0% of full scale associated with a given sensor device. Thesimulated calibration output that represents 0% of full scale is outputuntil time 1. At time 1, the simulated calibration output is adjusted tothe first intermediate simulated calibration output that represents 25%of full scale (e.g., adjusted up one output step size of 25%). Thesimulated calibration output that represents 25% of full scale is outputuntil time 2. At time 2, the simulated calibration output is adjustedagain to a second intermediate simulated calibration output thatrepresents 50% of full scale (e.g., adjusted up one output step size of25%). The simulated calibration output that represents 50% of full scaleis output until time 3. At time 3, the simulated calibration output isadjusted again to a third intermediate simulated calibration output thatrepresents 75% of full scale (e.g., adjusted up one output step size of25%). The simulated calibration output that represents 75% of full scaleis output until time 4.

At time 4, the simulated calibration output is adjusted again to aboundary simulated calibration output that represents 100% of full scale(e.g., adjusted up one output step size of 25%). The simulatedcalibration output that represents 100% of full scale is output untiltime 5. At time 5, the predefined output sequence reverses, such thateach subsequent simulated calibration output represents is an outputstep size down until the lower boundary simulated calibration output isreached (e.g., 0% as illustrated). It should be appreciated that thesimulated calibration output is adjusted down at times 5, 6, 7, and 8,similarly to the steps described above.

In some embodiments, once the predefined output sequence has performedfor a complete cycle (e.g., at time 8), the predefined output sequencemay repeat. For example, at time 9, the simulated calibration output mayagain be adjusted to a simulated calibration output that represents 25%of full scale (e.g., adjusted up one output step size of 25%). It shouldbe appreciated that, in some embodiments, various simulated calibrationoutputs are output in a defined sequence associated with an output stepsize and an automatic output adjustment time interval continuously untilcalibration mode is deactivated (e.g., measuring mode is activated).

It should be appreciated that, in some embodiments, the defined sequencefor a particular embodiment differs from the visualization 800. Forexample, the automatic output time shift interval may be longer (such as2 seconds) or shorter (such as 0.5 seconds). Alternatively oradditionally, the output step size for adjustments between simulatedcalibration outputs may be different. For example, in some embodiments,the output step size for adjustments between simulated calibrationoutputs is 10%. Alternatively or additionally still, in someembodiments, the upper and/or lower boundary simulated calibrationoutputs may be different. For example, in some embodiments, a lowerboundary simulated calibration output is above 0% of full scale (such as10% of full scale), and/or an upper boundary simulated calibrationoutput is below 100% of full scale (such as 90% of full scale).Accordingly, the example parameters associated with the visualization800 are a non-limiting example, and not to limit the scope and spirit ofthe disclosure.

Performing multi-point shunt calibration utilizing a predefined outputsequence associated with an output step size and an automatic outputadjustment time interval yields multiple benefits. Utilizing at leastone intermediate simulated calibration output enables embodiments tominimize errors associated with large changes in simulated calibrationoutputs (e.g., hysteresis and/or non-linearity problems). Additionally,embodiments enable calibration based on multiple simulated calibrationoutputs, which may enhance overall calibration and minimizenon-linearity, hysteresis, zero, and dead zone errors.

Conclusion

Having the benefit of the teachings presented in the foregoingdescriptions and the associated drawings, many modifications and otherembodiments of the present disclosure will come to mind to one skilledin the art to which this disclosure pertains. Therefore, it is to beunderstood that this disclosure is not limited to the specificembodiments disclosed herein, and that modifications and otherembodiments are intended to be included within the scope of the appendedclaims. Although specific terms are employed herein, they are used in ageneric and descriptive sense only and not for purposes of limitation.

What is claimed is:
 1. A multi-point shunt calibration sensor devicecomprising: a calibration component configured to communicate with asensor device, the calibration component configured to: determine afirst simulated calibration output associated with a first actualreading value and a first expected reading value, determine a secondsimulated calibration output associated with a second actual readingvalue and a second expected reading value, determine a third simulatedcalibration output associated with a third actual reading value and athird expected reading value, determine a calibrated sensor parametervalue associated with the measuring bridge component based on: (1) thefirst actual reading value and the first expected reading value, (2) thesecond actual reading value and the second expected reading value, and(3) the third actual reading value and the third expected reading value,and set at least one adjustable sensor parameter associated with thesensor device based on the determined calibrated sensor parameter value.2. The multi-point shunt calibration sensor device of claim 1, whereinthe first, second, and third expected reading values fall within anoperating range associated with the multi-point shunt calibration sensordevice.
 3. The multi-point shunt calibration sensor device of claim 1,wherein the shunt calibration component is further configured to:determine at least one additional simulated calibration output, whereeach additional simulated calibration output is associated with anadditional actual reading value and an additional expected readingvalue, and determine the calibrated sensor parameter value based on theat least one additional simulated calibration output.
 4. The multi-pointshunt calibration sensor device of claim 1, wherein the calibratedsensor parameter value is based on a first error value that depends uponthe first actual reading value and the first expected reading value, asecond error value based on the second actual reading value and thesecond expected reading value, and a third error value based on thethird actual reading value and the third expected reading value.
 5. Themulti-point shunt calibration sensor device of claim 1, wherein thefirst, second, and third simulated calibration outputs are associatedwith a predefined output sequence within an operating range associatedwith the sensor device.
 6. The multi-point shunt calibration sensordevice of claim 1, wherein the second simulated calibration output isdetermined after a first period of time following outputting of thefirst simulated calibration output; and the third simulated calibrationoutput is determined after a second period of time following outputtingof the second simulated calibration output.
 7. A sensor devicecomprising: at least a measuring bridge component and a shuntcalibration component, wherein the shunt calibration component isconfigured to: determine a first simulated calibration output associatedwith a first actual reading value; determine a second simulatedcalibration output associated with a second actual reading value;determine a third simulated calibration output associated with a thirdactual reading value; determine a calibrated sensor parameter valueassociated with the measuring bridge component based on the first actualreading value, the second actual reading value and the third actualreading value; set at least one adjustable sensor parameter associatedwith the sensor device based on the determined calibrated sensorparameter value.
 8. The sensor device of claim 7, wherein the calibratedsensor parameter value associated with the measuring bridge component isdetermined at least using the formula: $\frac{\left( {\begin{matrix}{{the}{Second}{Actual}} \\{{Reading}{Value}}\end{matrix} - \left( \frac{\begin{matrix}{{{the}{First}{Actual}{Reading}{Value}} +} \\{{the}{Third}{Actual}{Reading}{Value}}\end{matrix}}{2} \right)} \right)*100}{\begin{matrix}{{{the}{Third}{Actual}{Reading}{Value}} -} \\{{the}{First}{Actual}{Reading}{Value}}\end{matrix}}.$
 9. The sensor device of claim 7, wherein calibratedsensor parameter value associated with the measuring bridge component isdetermined based on a first expected reading value, a second expectedreading value and a third expected reading value, where the expectedreading values fall within an operating range associated with the sensordevice.
 10. The sensor device of claim 7, wherein the first, second, andthird simulated calibration outputs are associated with a predefinedoutput sequence within an operating range associated with the sensordevice.
 11. The sensor device of claim 7, wherein the shunt calibrationcomponent is further configured to: determine at least one additionalsimulated calibration output, where each additional simulatedcalibration output is associated with an additional actual reading valueand an additional expected reading value, and determine the calibratedsensor parameter value based on the at least one additional simulatedcalibration output.
 12. The sensor device of claim 7, wherein thecalibrated sensor parameter value is based on a first error value thatdepends upon the first actual reading value and the first expectedreading value, a second error value based on the second actual readingvalue and the second expected reading value, and a third error valuebased on the third actual reading value and the third expected readingvalue.
 13. The sensor device of claim 7, wherein the second simulatedcalibration output is determined after a first period of time followingoutputting of the first simulated calibration output, and the thirdsimulated calibration output is determined after a second period of timefollowing outputting of the second simulated calibration output.
 14. Amulti-point shunt calibration method comprising: determining a firstsimulated calibration output associated with a first actual readingvalue and a first expected reading value; determining a second simulatedcalibration output associated with a second actual reading value and asecond expected reading value, determining a third simulated calibrationoutput associated with a third actual reading value and a third expectedreading value, determining a calibrated sensor parameter value based on:(1) the first actual reading value and the first expected reading value,(2) the second actual reading value and the second expected readingvalue, and (3) the third actual reading value and the third expectedreading value, and setting at least one adjustable sensor parameterassociated with a sensor device based on the determined calibratedsensor parameter value.
 15. The multi-point shunt calibration method ofclaim 14, wherein the first, second, and third expected reading valuesfall within an operating range associated with the multi-point shuntcalibration sensor device.
 16. The multi-point shunt calibration methodof claim 14, wherein the shunt calibration component is furtherconfigured to: determine at least one additional simulated calibrationoutput, where each additional simulated calibration output is associatedwith an additional actual reading value and an additional expectedreading value, and determine the calibrated sensor parameter value basedon the at least one additional simulated calibration output.
 17. Themulti-point shunt calibration method of claim 14, wherein the calibratedsensor parameter value is based on a first error value that depends uponthe first actual reading value and the first expected reading value, asecond error value based on the second actual reading value and thesecond expected reading value, and a third error value based on thethird actual reading value and the third expected reading value.
 18. Themulti-point shunt calibration method of claim 14, wherein the first,second, and third simulated calibration outputs are associated with apredefined output sequence within an operating range associated with thesensor device.
 19. The multi-point shunt calibration method of claim 14,wherein the second simulated calibration output is determined after afirst period of time following outputting of the first simulatedcalibration output; and the third simulated calibration output isdetermined after a second period of time following outputting of thesecond simulated calibration output.